News

27.04.18: SID Display Week 2018: Highlights of display measurement technology

View direction dependent display measurement on the DMS 803
We will be staging live demonstrations of our DMS 803 goniometric measuring system for the quality analysis of a variety of displays. The latter analyzes the luminance, contrast and color characteristics dependent on the angle of view for every display technology. New software functionality for spectral diffuse reflectance (SDR) enables OLED measurements under the influence of ambient light according to IEC 62341-6-2.

Automotive interior measurement – LumiCam 2400 and DTS 140D
With its effective resolution of 5 megapixels, our new LumiCam 2400 imaging colorimeter permits fast spatially resolved analysis of multifunctional displays in vehicles and displays. At our exhibition stand we will also be demonstrating the high-precision spectral characterization of displays and automotive interior lighting using our all-in-one system DTS 140D comprising the TOP 200 and the new CAS 140D spectroradiometer.

Display production testing – LumiTop 2700
Instrument Systems will be exhibiting the LumiTop 2700 imaging colorimeter in a production-typical setup for use in display production testing. The advantages of a RGB-CCD camera and flicker diode with a high-precision spectroradiometer of the CAS 140 series have been successfully combined in one system. At its stand, the Munich-based light measurement technology specialists will be offering live demonstrations of the perfect integration of the LumiTop 2700 into display production lines.
See our innovations for yourself and visit us at booth 1329. Our sales engineers will be pleased to show our measurement solutions in action.

Read our latest press release.

A paper themed “Display Metrology: Basics, Framework and Applications” delivered by Dr. Michael E. Becker, expert for display measurement technology, will round off Instrument System’s exhibition presentation:

21.5.2018, SID Display Week 2018, Monday Seminars, Track 3,
12:50 – 2:20pm, “Display Metrology: Basics, Framework and Applications”,
Dr. Michael E. Becker.