Proven solutions for testing μLED wafers, AR/VR Near-Eye displays and VCSEL arrays

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Date: 10.09.2020 – 10.09.2020

Collin Jiang

Location: China International Optoelectronic Exposition

The presentation shows solutions for Micro LED Wafer testing and VCSEL spectral measurement (VCSEL Near- and Far-Field measurement).

China International Optoelectronic Exposition
Photonics Germany @ CIOE 2020
Time: 1 pm – 5 pm Shenzhen
Location: World Exhibition & Convention Center ∙ Conference Room 2, Hall 1

 

 

 

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