Visit us at LASER Shanghai on 03-05 July 2020 at the National Convention & Exhibition Center Shanghai! We are excited to show our high-quality solutions in light measurement on two exhibition areas which make Instrument Systems your ideal partner for various measurement applications in the area of display production testing as well as spectral measurements of LEDs und VCSELs.
San Jose, USA04.08.2020 - 06.08.2020
Booth #1220 Co-Exhibitor: Konica Minolta Sensing US
Article by Dr. Tobias Steinel and Dr. Martin Wolf03.06.2020
Although microLED displays are a promising technology, they pose new challenges for metrology. Here, two authors from Instrument Systems show how an imaging light measurement device made of a 150-megapixel RGB sensor and a high-end spectroradiometer can provide faster and more accurate microLED measurements.
Dr. Tobias Steinel
SID Display Week 2020
San Jose Mc Enery Convention Center, Room LL20BC
Thursday, August 6, 2020, 03:10 PM - 04:30 PM
Calibration UV-LEDs of the Instrument Systems ACS series are extremely stable UV sources on LED basis that are traceable to radiant flux. They exhibit an extremely low measurement uncertainty (k=2) of only 4.5% (UVC), 3.5% (UVB) and 2% (UVA) and are available for typical peak wavelengths 280 nm (ACS-570-24), 305 nm (ACS-570-26), and 365 nm (ACS-570-28). Calibration UV-LEDs are used for absolute calibration and monitoring of UV measuring equipment.