Whitepaper

Discover how high-accuracy optical metrology helps overcome key challenges in MicroLED manufacturing – from wafer characterization to final display testing. This white paper explains how fast, spectrally accurate measurement systems can improve yield, reduce false rejects, and support reliable mass production. Learn how advanced imaging colorimetry and spectroradiometry enable efficient quality control for next-generation MicroLED applications.

Optical see-through AR promises seamless overlays, yet real-world backgrounds reshape contrast, color, and uniformity of the virtual image. We quantify how luminance, chromaticity, and spatial structure constrain influence the virtual image using calibrated photometric and colorimetric measurements and additive color-mixing analysis. Learn key trade-offs between visibility and transparency - and optimization guidance for AR systems.

We extend LIV+λ measurements to individual emitters within a VCSEL array, thereby incorporating polarization measurements. To assess the characteristics of the VCSEL array in diverse environmental conditions, measurements were conducted at multiple temperatures.

We present the results of our laser safety considerations based on the international laser safety norm specially applied to typical pulsed VCSEL arrays. We provide the basics and discuss a general approach to this topic.

We develop a step-by-step analysis of how to assess the laser safety of typical pulsed VCSELs and VCSEL arrays as often used in consumer electronics and automotive LiDAR applications. We offer two examples that represent typical challenges when dealing with VCSEL sources.

We introduce the new goniometer DMS 904 that is specially developed for large and curved displays for customers in the automotive sector. Characterization of the quality of curved displays involves the measurement of many metrological parameters. And the ever-increasing size of this displays includes a very special challenge for optical display measurement technology.

We deal with the difference between precise, accurate or even absolute measurement results and consider different factors that play an important role for the correct interpretation of measurement results, as they have a significant impact on the error budget.

We outline a selection of main OEM display requirements, how test parameters can be experimentally verified and discuss what to expect in regards of time efficiency for EOL solutions.

We discuss the main challenges in the measurement of UV radiation in the context of UV LEDs. The focus is on the comparison of integrating spheres (ISP) with barium sulfate (BaSO4) reflective coating (typically used for VIS and IR applications) and polytetrafluoroethylene (PTFE) reflective material for the measurement of radiant power in the spectral range between 200 and 400 nm.