Datum: 06.08.2020 – 05.08.2020
Dr. Tobias Steinel
Novel display technologies come with new measurement challenges to meet the highest quality standards in mass production. Here we shine light on these challenges and discuss innovative testing solutions to assure highest display quality in production takt times. We present how single pixel analysis can improve display quality by using a statistical approach to non-uniformity of luminance as well as color metrology on sub-pixel level. Applications for smartphone displays and microdisplays are discussed emphasizing the challenges of very small pixels and pixel pitches. Finally, calibration of light measuring devices are challenged with respect to the specific spectral properties of μLEDs and OLEDs.
SID Symposium, Session 71.3, 2020-08-06