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Anstehende Vorträge – Unsere Experten live

Comprehensive Extended Reality Test and Audit Solutions for Near-Eye Displays, Headset Infrared Light Sources and Optical Components
Datum: 20.09.2022 – 21.09.2022
Dr. Tobias Steinel
Ort: online

Fast 2D Display Testing with Spectrally Corrected Colorimeters
Datum: 28.09.2022
Justin Blanke
Ort: Detroit/MI, USA | 11.40 Uhr (GMT-6)

VCSEL Characterization: LiDAR and Eye-Safety Testing
Datum: 28.09.2022
Justin Blanke
Ort: Detroit/MI, USA | 12.00 Uhr (GMT-6)
Bereits gehaltene Vorträge

Uniformity of OLED Displays at Ultra Low Luminance
Datum: 16.07.2022 – 19.07.2022
Andreas Liebel
Ort: ICDT/ online

Luminance Dependent Uniformity in OLED Displays
Datum: 22.06.2022, 13 (GMT+1)
Dr. Tobias Steinel
Ort: electronic displays conference, Nürnberg

The importance of polarization characterization and eye safety assessment of VCSELs
Datum: 13.06.2022, 15 (GMT+2)
Dr. Karthik Iyer
Ort: EPIC Online Technology Meeting

Spatially-resolved polarization characterization of VCSEL arrays
Datum: 27.01.2022, 11 (GMT-8)
Dr. Frank Münchow
Ort: San Francisco/CA, USA

Sharpness and Contrast of AR/VR Near-Eye Displays: Goniometric vs. Advanced 2D Imaging Light Measurements of the Modulation Transfer Function (MTF)
Datum: 23.01.2022 – 25.01.2022 (GMT-8)
Dr. Tobias Steinel
Ort: San Francisco/CA, USA

One Shot: Polarization Characterization of VCSELs
Datum: 12.01.2022 – 12.01.2022
Ort: Online

AR/VR Near-Eye Displays: ihre besonderen Herausforderungen bei der Display-Qualitätskontrolle
Datum: 03.12.2021, 9 (GMT+9)
Dr. Cameron Hughes
Ort: IDW'21 Virtuelle Konferenz

Schnelles Testen von VCSEL-Arrays im Nahfeld-Bereich mit der VTC 4000
Datum: 02.11.2021, 16 (CET)
Dr. Karthik Iyer
Ort: Virtuell

Measurement systems in the UV A/B/C range
Datum: 01.08.2021 – 05.08.2021 (on demand)
Dr. Ðenan Konjhodžić
Ort: virtuell | Optics + Photonics, San Diego/ Kalifornien, USA

MicroLED Messtechnik: Herausforderungen und Lösungen
Datum: 01.06.2021 (Peking)
Dr. Tobias Steinel
Ort: ICDT, Online / Beijing Etrong International Exhibition & Convention Center, Konferenzhalle 1, Meetingraum C

Measurement systems and calibrations for UV radiation
Datum: 20.04.2021, 13
Dr. Ðenan Konjhodžić
Ort: Online

Quality control of AR/VR near-eye-displays: Goniometric versus advanced 2D imaging light measurements
Datum: 28.03.2021 – 30.03.2021
Dr. Tobias Steinel
Ort: SPIE AR/VR/MR, Live on Demand, Conference 11765-36

Human-Centric Quality Control of AR/VR Near-Eye-Displays and AR-HUDs
Datum: 05.03.2021, 11
Dr. Tobias Steinel
Ort: electronic displays Conference 2021 Digital

Characterization of VCSELs for 3D sensing applications according to the IEC60825-1 Standard
Datum: 19.01.2021, 7 (EST)
Dr. Katharina Predehl
Ort: Online Event

Methods to measure the luminous color of white and colored LEDs
Datum: 02.12.2020 – 02.12.2020
Dr. Hassan Gargouri
Ort: DVN Tokio 2020

New LED calibration standards in the UV A/B/C range
Datum: 22.09.2020 – 25.09.2020
Dr. Đenan Konjhodžić

Eye safety of VCSEL arrays
Datum: 11.09.2020 – 11.09.2020
Ort: Dr. Katharina Predehl

Proven solutions for testing μLED wafers, AR/VR Near-Eye displays and VCSEL arrays
Datum: 10.09.2020 – 10.09.2020
Collin Jiang
Ort: China International Optoelectronic Exposition

Meeting Optical Testing Challenges of High-Resolution µLED-Displays
Datum: 06.08.2020 – 05.08.2020
Dr. Tobias Steinel

Electro-optical transfer characteristic, the undervalued display feature
Datum: 06.08.2020 – 06.08.2020
Dr. Michael E. Becker

End-of-line (EOL) Testing of Recent OEM Display Quality Standards
Datum: 26.02.2020 – 26.02.2020
Dr. Silke Kirchner

Light Measurement Device For Subpixel Evaluation Of Micro-LED And OLED Displays
Datum: 26.11.2019
Dr. Tobias Steinel

Characterization of Blue Light Hazard
Datum: 10.10.2019 – 31.12.2019
Dr. Ðenan Konjhodžić

An Evaluation Guide for Blue Light Hazard
Datum: 26.09.2019 – 31.12.2019
Dr. Ðenan Konjhodžić

End-Of-Line Testing of Recent Display Quality Standards
Datum: 25.09.2019 – 31.12.2019
Dr. Silke R. Kirchner

Ultra high resolution imaging light measurement device for subpixel metrology of micro-LEDs and OLEDs
Datum: 19.09.2019 – 31.12.2019
J.Blanke, T.Steinel, M.Wolf

Evaluation of Blue Light Hazard
Datum: 18.06.2019 – 31.12.2019
Dr. Ðenan Konjhodžić

Flicker from Electronic Displays: Reconsidering the Confusion
Datum: 16.05.2019 – 31.12.2019
Dr. Michael E. Becker

Metrological Challenges of Non-Planar Displays
Datum: 28.03.2019 – 31.12.2019
Andreas Kreisel