Fachvorträge
Anstehende Vorträge – Unsere Experten live
Fundamentals of Display Metrology
Datum: 12.05.2024
Dr. Ferdinand Deger
Display Metrology Training Course in Kooperation mit Radiant Vision Systems
Ort: Display Week, San José/CA, USA
Impact of Calibration Sources on Accuracy of Chromaticity Measurements
Datum: 16.05.2024, 09:40 Uhr (GMT-8)
Dr. Tobias Steinel
Session 58.3
Ort: Display Week, San José, CA/ USA
Bereits gehaltene Vorträge
Characterization of Semiconductor Lasers at SWIR Wavelength
Datum: 11.04.2024, 13:40 Uhr (GMT+1)
Dr. Amir Sharghi
Paper 13002-29
Ort: Straßburg, Frankreich
Live Colorimeter Calibration Adapts to Spectral Variations of Measurement Object
Datum: 10.04.2024, 13:20 Uhr (GMT+1)
Dr. Tobias Steinel
Ort: electronic displays conference, Nürnberg
Matching One-Shot Imaging Light Measurement Devices with Goniophotometer Measurements in VR Applications
Datum: 10.04.2024 – 11.04.2024
Dr. Sascha Reinhardt
Ort: electronic displays conference, Nürnberg
One-shot single-emitter-resolved polarization and LIV+λ characterization of a VCSEL array at tempered conditions
Datum: 31.01.2024, 11:35 Uhr (GMT-8)
Dr. Amir Sharghi
Session 12904-11
Ort: SPIE Photonics West, San Francisco/CA, USA
Safety Assessment of Virtual Reality eye tracking modules
Datum: 29.01.2024, 15:30 Uhr (GMT-8)
Dr. Amir Sharghi
Session 12913-55
Ort: SPIE AR|VR|MR, San Francisco/CA, USA
Light measurement and quality control at different production stages of a virtual reality headset
Datum: 29.01.2024, 10:50 Uhr (GMT-8)
Dr. Tobias Steinel
Session 12913-45
Ort: SPIE AR|VR|MR, San Francisco/ CA, USA
Rapid Testing of µLEDs and µDisplays on Wafer
Datum: 12.10.2023, 15:30 Uhr (GMT+8)
Tianxing Zhu
Ort: C-Touch & Displays, Shenzhen, China
Optical characterization of curved displays
Datum: 27.09.2023, 02:20 Uhr (GMT-4)
Kevin Lange
Ort: SID Vehicle Displays & Interfaces, Detroit/MI, USA
Light Measurement of VR devices
Datum: 13.09.2023, 14:30 Uhr (CEST)
Dr. Sascha Reinhardt
Ort: DSCC AR/VR Forum - online
Rapid Testing of µLEDs and Microdisplays on Wafer
Datum: 05.09.2023, 11:10 Uhr (GMT+8)
Jack Hwang
Ort: Micro LEDForum 2023, Taipeh/ Taiwan
Massive Parallelization of Optical Quality Control of μLED Displays and Wafers
Datum: 06.07.2023, 14:50 Uhr (GMT+2)
Dr. Tobias Steinel
Ort: 2. Focus Meeting des DFF, Ittervoort/ Niederlande
High-throughput MicroLED Wafer Testing
Datum: 04.07.2023, 11:30 Uhr (GMT+2)
Dr. Tobias Steinel
Ort: online
Two-dimensional LIV and beam quality characterization of individual emitters in a VCSEL array
Datum: 28.06.2023, 08:40 Uhr (GMT+2)
Dr. Amir Sharghi
Ort: SPIE Digital Optical Technologies, München
Rapid Testing of μLEDs and Microdisplays on Wafer
Datum: 02.04.2023, 17:10 Uhr (GMT+8)
Dr. Tobias Steinel
Ort: ICDT / online
Characterization and Prevention of Global and Rolling Shutter Artifacts in Display Metrology
Datum: 15.03.2023, 16:10 Uhr (GMT+1)
Andreas Liebel
Ort: electronic displays conference, Nürnberg
Validating distortion measurements of wide-field-of-view near-eye displays
Datum: 30.01.2023 – 01.02.2023, 18:00 Uhr (GMT -8)
Dr. Tobias Steinel
Ort: SPIE AR|VR|MR , San Francisco/CA, USA
New High resolution Infrared Array spectrometer CAS 140D IR
Datum: 08.11.2022, 16:00 Uhr (CET)
Claudia Dippold
Ort: online
Fast 2D Display Testing with Spectrally Corrected Colorimeters
Datum: 27.09.2022, 11:40 Uhr (EST)
Justin Blanke
Ort: Detroit/MI, USA
VCSEL Characterization: LiDAR and Eye-Safety Testing
Datum: 27.09.2022, 12:00 Uhr (EST)
Justin Blanke
Ort: Detroit/MI, USA
Comprehensive Extended Reality Test and Audit Solutions for Near-Eye Displays, Headset Infrared Light Sources and Optical Components
Datum: 20.09.2022, 09:30 Uhr (EST)
Dr. Tobias Steinel
Ort: online
Uniformity of OLED Displays at Ultra Low Luminance
Datum: 15.07.2022 – 18.07.2022
Andreas Liebel
Ort: ICDT/ online
Luminance Dependent Uniformity in OLED Displays
Datum: 21.06.2022
Dr. Tobias Steinel
Ort: electronic displays conference, Nürnberg
The importance of polarization characterization and eye safety assessment of VCSELs
Datum: 12.06.2022
Dr. Karthik Iyer
Ort: EPIC Online Technology Meeting
Spatially-resolved polarization characterization of VCSEL arrays
Datum: 26.01.2022
Dr. Frank Münchow
Ort: San Francisco/CA, USA
Sharpness and Contrast of AR/VR Near-Eye Displays: Goniometric vs. Advanced 2D Imaging Light Measurements of the Modulation Transfer Function (MTF)
Datum: 22.01.2022 – 24.01.2022
Dr. Tobias Steinel
Ort: San Francisco/CA, USA
One Shot: Polarization Characterization of VCSELs
Datum: 11.01.2022 – 11.01.2022
Ort: Online
AR/VR Near-Eye Displays: ihre besonderen Herausforderungen bei der Display-Qualitätskontrolle
Datum: 02.12.2021
Dr. Cameron Hughes
Ort: IDW'21 Virtuelle Konferenz
Schnelles Testen von VCSEL-Arrays im Nahfeld-Bereich mit der VTC 4000
Datum: 01.11.2021
Dr. Karthik Iyer
Ort: Virtuell
Measurement systems in the UV A/B/C range
Datum: 31.07.2021 – 04.08.2021
Dr. Ðenan Konjhodžić
Ort: virtuell | Optics + Photonics, San Diego/ Kalifornien, USA
MicroLED Messtechnik: Herausforderungen und Lösungen
Datum: 31.05.2021
Dr. Tobias Steinel
Ort: ICDT, Online / Beijing Etrong International Exhibition & Convention Center, Konferenzhalle 1, Meetingraum C
Measurement systems and calibrations for UV radiation
Datum: 19.04.2021
Dr. Ðenan Konjhodžić
Ort: Online
Quality control of AR/VR near-eye-displays: Goniometric versus advanced 2D imaging light measurements
Datum: 27.03.2021 – 29.03.2021
Dr. Tobias Steinel
Ort: SPIE AR/VR/MR, Live on Demand, Conference 11765-36
Human-Centric Quality Control of AR/VR Near-Eye-Displays and AR-HUDs
Datum: 04.03.2021
Dr. Tobias Steinel
Ort: electronic displays Conference 2021 Digital
Characterization of VCSELs for 3D sensing applications according to the IEC60825-1 Standard
Datum: 18.01.2021
Dr. Katharina Predehl
Ort: Online Event