Fachvorträge
Anstehende Vorträge – Unsere Experten live

Two-dimensional LIV and beam quality characterization of individual emitters in a VCSEL array
Datum: 28.06.2023, 08:40 Uhr (GMT+2)
Dr. Amir Sharghi
Ort: SPIE Digital Optical Technologies, München

High-throughput MicroLED Wafer Testing
Datum: 04.07.2023
Dr. Tobias Steinel
Ort: online
Bereits gehaltene Vorträge

Rapid Testing of μLEDs and Microdisplays on Wafer
Datum: 02.04.2023, 17:10 Uhr (GMT+8)
Dr. Tobias Steinel
Ort: ICDT / online

Characterization and Prevention of Global and Rolling Shutter Artifacts in Display Metrology
Datum: 15.03.2023, 16:10 Uhr (GMT+1)
Andreas Liebel
Ort: electronic displays conference, Nürnberg

Validating distortion measurements of wide-field-of-view near-eye displays
Datum: 30.01.2023 – 01.02.2023, 18:00 Uhr (GMT -8)
Dr. Tobias Steinel
Ort: SPIE AR|VR|MR , San Francisco/CA, USA

New High resolution Infrared Array spectrometer CAS 140D IR
Datum: 08.11.2022, 16:00 Uhr (CET)
Claudia Dippold
Ort: online

Fast 2D Display Testing with Spectrally Corrected Colorimeters
Datum: 27.09.2022, 11:40 Uhr (EST)
Justin Blanke
Ort: Detroit/MI, USA

VCSEL Characterization: LiDAR and Eye-Safety Testing
Datum: 27.09.2022, 12:00 Uhr (EST)
Justin Blanke
Ort: Detroit/MI, USA

Comprehensive Extended Reality Test and Audit Solutions for Near-Eye Displays, Headset Infrared Light Sources and Optical Components
Datum: 20.09.2022, 09:30 Uhr (EST)
Dr. Tobias Steinel
Ort: online

Uniformity of OLED Displays at Ultra Low Luminance
Datum: 15.07.2022 – 18.07.2022
Andreas Liebel
Ort: ICDT/ online

Luminance Dependent Uniformity in OLED Displays
Datum: 21.06.2022
Dr. Tobias Steinel
Ort: electronic displays conference, Nürnberg

The importance of polarization characterization and eye safety assessment of VCSELs
Datum: 12.06.2022
Dr. Karthik Iyer
Ort: EPIC Online Technology Meeting

Spatially-resolved polarization characterization of VCSEL arrays
Datum: 26.01.2022
Dr. Frank Münchow
Ort: San Francisco/CA, USA

Sharpness and Contrast of AR/VR Near-Eye Displays: Goniometric vs. Advanced 2D Imaging Light Measurements of the Modulation Transfer Function (MTF)
Datum: 22.01.2022 – 24.01.2022
Dr. Tobias Steinel
Ort: San Francisco/CA, USA

One Shot: Polarization Characterization of VCSELs
Datum: 11.01.2022 – 11.01.2022
Ort: Online

AR/VR Near-Eye Displays: ihre besonderen Herausforderungen bei der Display-Qualitätskontrolle
Datum: 02.12.2021
Dr. Cameron Hughes
Ort: IDW'21 Virtuelle Konferenz

Schnelles Testen von VCSEL-Arrays im Nahfeld-Bereich mit der VTC 4000
Datum: 01.11.2021
Dr. Karthik Iyer
Ort: Virtuell

Measurement systems in the UV A/B/C range
Datum: 31.07.2021 – 04.08.2021 (on demand)
Dr. Ðenan Konjhodžić
Ort: virtuell | Optics + Photonics, San Diego/ Kalifornien, USA

MicroLED Messtechnik: Herausforderungen und Lösungen
Datum: 31.05.2021 (Peking)
Dr. Tobias Steinel
Ort: ICDT, Online / Beijing Etrong International Exhibition & Convention Center, Konferenzhalle 1, Meetingraum C

Measurement systems and calibrations for UV radiation
Datum: 19.04.2021
Dr. Ðenan Konjhodžić
Ort: Online

Quality control of AR/VR near-eye-displays: Goniometric versus advanced 2D imaging light measurements
Datum: 27.03.2021 – 29.03.2021
Dr. Tobias Steinel
Ort: SPIE AR/VR/MR, Live on Demand, Conference 11765-36

Human-Centric Quality Control of AR/VR Near-Eye-Displays and AR-HUDs
Datum: 04.03.2021
Dr. Tobias Steinel
Ort: electronic displays Conference 2021 Digital

Characterization of VCSELs for 3D sensing applications according to the IEC60825-1 Standard
Datum: 18.01.2021
Dr. Katharina Predehl
Ort: Online Event

Methods to measure the luminous color of white and colored LEDs
Datum: 01.12.2020 – 01.12.2020
Dr. Hassan Gargouri
Ort: DVN Tokio 2020

New LED calibration standards in the UV A/B/C range
Datum: 21.09.2020 – 24.09.2020
Dr. Đenan Konjhodžić

Eye safety of VCSEL arrays
Datum: 10.09.2020 – 10.09.2020
Ort: Dr. Katharina Predehl

Proven solutions for testing μLED wafers, AR/VR Near-Eye displays and VCSEL arrays
Datum: 09.09.2020 – 09.09.2020
Collin Jiang
Ort: China International Optoelectronic Exposition

Meeting Optical Testing Challenges of High-Resolution µLED-Displays
Datum: 05.08.2020 – 04.08.2020
Dr. Tobias Steinel

Electro-optical transfer characteristic, the undervalued display feature
Datum: 05.08.2020 – 05.08.2020
Dr. Michael E. Becker

End-of-line (EOL) Testing of Recent OEM Display Quality Standards
Datum: 25.02.2020 – 25.02.2020
Dr. Silke Kirchner