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Rapid Testing of μLEDs and Microdisplays on Wafer

Datum: 02.04.2023, 17:10 Uhr (GMT+8)

Dr. Tobias Steinel


Ort: ICDT / online

The upcoming μLED display technology promises high contrast, fast response time, wide color gamut, low power consumption, and long lifetime. But, the technology is challenging for optical quality control, especially for narrow bandwidth μLEDs.


Characterization and Prevention of Global and Rolling Shutter Artifacts in Display Metrology

Datum: 15.03.2023, 16:10 Uhr (GMT+1)

Andreas Liebel


Ort: electronic displays conference, Nürnberg

State of the art displays do have the ability to modulate refresh rate and duty cycle in order to save energy and to adapt to the display content. These features pose new challenges to display metrology equipment and may produce image artefacts. Here, we discuss the characterization and prevention of image artifacts due to the shutter type of the camera used for high accuracy display testing.


Validating distortion measurements of wide-field-of-view near-eye displays

Datum: 30.01.2023 – 01.02.2023, 18:00 Uhr (GMT -8)

Dr. Tobias Steinel


Ort: SPIE AR|VR|MR , San Francisco/CA, USA

Near-Eye Displays covering a large field of view require complex optical imaging systems. While the optical system is designed to minimize distortion, residual distortion, material or production flaws lead to significant distortion. Imaging light measurement devices (ILMD) are used to detect distortion for product quality assurance. However, imaging measurement systems, especially with wide-angle lenses, may also add distortion to the measurement. Therefore, the calibration of ILMDs is crucial for the measurement of AR/VR device distortion. Here, we quantify and validate the accuracy of methods of distortion correction for an imaging light measurement device with a field of view of 120°.


Tägliche Poster Session von 18.00-19.30 Uhr


New High resolution Infrared Array spectrometer CAS 140D IR

Datum: 08.11.2022, 16:00 Uhr (CET)

Claudia Dippold


Ort: online

In this EPIC Members New Product Release, our Product Manager Claudia Dippold will introduce Instrument Systems' latest CAS 140D IR spectroradiometer for measurements in the infrared range. It features the proven high measurement accuracy and reliability of the CAS140D series, recognized all over the world as a reference for wavelengths from 780–1700 nm. Compared to its predecessor model, the new CAS 140D IR offers significantly improved performance in signal sensitivity, stray light suppression and electronics.


Fast 2D Display Testing with Spectrally Corrected Colorimeters

Datum: 27.09.2022, 11:40 Uhr (EST)

Justin Blanke


Ort: Detroit/MI, USA

Displays are becoming more and more prevalent in the automotive cabin and must serve a variety of functions flawlessly in a challenging environment. Specialized analysis to measure effects such as Black Mura must be conducted according to established standards; this enables meaningful comparison between supplier and manufacturer.


VCSEL Characterization: LiDAR and Eye-Safety Testing

Datum: 27.09.2022, 12:00 Uhr (EST)

Justin Blanke


Ort: Detroit/MI, USA

Vertical-cavity surface-emitting lasers (VCSELs) perfectly fulfill the requirements for present and future 3D sensing applications. However, to operate VCSEL-based devices in public, the manufacturer must assure “eye safe” operation compliant with the IEC 60825-1 standard or national equivalents. As VCSELs exhibit special emission characteristics that differ from other laser sources, the safety assessment is more complex, and a practical guideline does not exist.


Comprehensive Extended Reality Test and Audit Solutions for Near-Eye Displays, Headset Infrared Light Sources and Optical Components

Datum: 20.09.2022, 09:30 Uhr (EST)

Dr. Tobias Steinel


Ort: online

Visible and infrared light measurement devices (LMDs) are essential tools for developing novel extended reality display and sensing technologies as well as for quality assurance in the display and headset mass production. Extended reality devices come with a multitude of test requirements and the need to measure the same way as the human eye sees, and also might require different LMDs in the development and production phases.


Uniformity of OLED Displays at Ultra Low Luminance

Datum: 15.07.2022 – 18.07.2022

Andreas Liebel


Ort: ICDT/ online

Next generation OLEDs displays have in principle endless contrast ratios due to their emittive nature. However, in practice OLED displays show non-uniformities at very low luminance which have to be measured and corrected in order to maintain constant contrast.

In this presentation, uniformity measurements at very low luminance will be presented and results from displays from a variety of manufacturers will be compared.


Luminance Dependent Uniformity in OLED Displays

Datum: 21.06.2022

Dr. Tobias Steinel


Ort: electronic displays conference, Nürnberg

Next generation OLEDs displays have in principle endless contrast ratios due to their emittive nature and their ability to completely turn off pixels. This makes them ideal in applications that require low display luminance like use in dark/nighttime conditions.


The importance of polarization characterization and eye safety assessment of VCSELs

Datum: 12.06.2022

Dr. Karthik Iyer


Ort: EPIC Online Technology Meeting

Novel VCSEL arrays require spatial testing of the whole ensemble as well as of the single emitters in the near-field. Such optical measurements must be calibrated, corrected for polarization dependency and traceable to ensure minimum error budgets for eye safety evaluation.


Spatially-resolved polarization characterization of VCSEL arrays

Datum: 26.01.2022

Dr. Frank Münchow


Ort: San Francisco/CA, USA

Although VCSELs are intrinsically single-longitudinal mode devices, they usually show complex polarization characteristics. Most VCSEL are not designed to emit in a single polarization state, there is no control about the polarization angle. The light emitted by the VCSEL typically show a complicated polarization, even within one emitter and abrupt polarization switching can be observed when temperature or bias current is changed. In this presentation we show a method of measuring spatially resolved polarization characteristics of VCSELs. This is achieved using a combination of polarization filtered microscope optics and a CMOS camera.


Sharpness and Contrast of AR/VR Near-Eye Displays: Goniometric vs. Advanced 2D Imaging Light Measurements of the Modulation Transfer Function (MTF)

Datum: 22.01.2022 – 24.01.2022

Dr. Tobias Steinel


Ort: San Francisco/CA, USA

Novel display technologies for AR/VR/MR devices require distinct tests to control quality during development and in production. Sharpness and contrast tests are particularly important due to the complex overlay of real and augmented images. Clear and immersive perception of the augmented or virtual reality requires optimal optical differentiation between different display contents. Typically, the modulation transfer function (MTF) acts a measure for sharpness and contrast. For accurate MTF measurement, an imaging test system should be based on a lens system that mimics the human eye system and have a similar-sized entrance pupil in front of the lens.


One Shot: Polarization Characterization of VCSELs

Datum: 11.01.2022 – 11.01.2022


Ort: Online

VCSEL-based sensor technology supports innovative applications. As VCSELs have special properties, in contrast to other typical laser sources, their characterization is more complex.


AR/VR Near-Eye Displays: ihre besonderen Herausforderungen bei der Display-Qualitätskontrolle

Datum: 02.12.2021

Dr. Cameron Hughes


Ort: IDW'21 Virtuelle Konferenz

Die Darstellung virtueller Bilder mit Near-Eye Displays (NEDs) kann eine Vielzahl zu überprüfender Effekte aufweisen, wie z.B. Verzerrungen und Unschärfen. In seinem Vortrag erläutert Dr. Cameron Hughes, warum ein spektral optimiertes Kamerasystem wie die LumiTop ideal für schnelle und präzise Produktionstests dieser Displays geeignet ist.


Schnelles Testen von VCSEL-Arrays im Nahfeld-Bereich mit der VTC 4000

Datum: 01.11.2021

Dr. Karthik Iyer


Ort: Virtuell

Während des EPIC Members New Product Release, präsentierte Dr. Karthik Iyer, Programm Manager bei Instrument Systems, unsere Nahfeld-Kamera VTC 4000 für die schnelle und präzise Analyse von VCSEL-Arrays.


Measurement systems in the UV A/B/C range

Datum: 31.07.2021 – 04.08.2021 (on demand)

Dr. Ðenan Konjhodžić


Ort: virtuell | Optics + Photonics, San Diego/ Kalifornien, USA

Nowadays, the pandemic situation caused by the COVID-19 virus inspired many companies, research institutes and lighting designers to adopt UV radiation as a new tool in their projects and research. The promising germicidal effect of the UVC radiation also on the Coronavirus raises the question of the reliable measurement of the UV radiation. However, this complex task needs an expertise and appropriate equipment.


MicroLED Messtechnik: Herausforderungen und Lösungen

Datum: 31.05.2021 (Peking)

Dr. Tobias Steinel


Ort: ICDT, Online / Beijing Etrong International Exhibition & Convention Center, Konferenzhalle 1, Meetingraum C

Die aufstrebende μLED Displaytechnologie verspricht hohe Kontraste, schnelle Antwortzeiten, ein breites Farbspektrum, geringen Energieverbrauch und Langlebigkeit. Jedoch ist die Technologie nicht nur eine Herausforderung hinsichtlich des Massentransfers der μLED vom Wafer auf das Display, sondern auch hinsichtlich der massiven Parallelisierung optischer Qualitätskontrolle in unterschiedlichen Fertigungsschritten.


Measurement systems and calibrations for UV radiation

Datum: 19.04.2021

Dr. Ðenan Konjhodžić


Ort: Online

Nowadays, the pandemic situation caused by the COVID-19 virus inspired many companies, research institutes and lighting designers to adopt UV radiation as a new tool in their projects and research. The promising germicidal effect of the UVC radiation also on the Coronavirus raises the question of the reliable measurement of the UV radiation. However, this complex task needs an expertise and appropriate equipment.

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Quality control of AR/VR near-eye-displays: Goniometric versus advanced 2D imaging light measurements

Datum: 27.03.2021 – 29.03.2021

Dr. Tobias Steinel


Ort: SPIE AR/VR/MR, Live on Demand, Conference 11765-36

Novel display technologies for AR/VR/MR devices require advanced imaging systems to control quality during assembly and to calibrate the device. Such calibration yields an optimal match of left and right eye and allows color management for an accurate match of real world and virtual objects. For accurate measurement, such an imaging system should be based on a lens system that mimics the human eye system and have a similar-sized entrance pupil in front of the lens. Traditionally two approaches have been proposed:

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Human-Centric Quality Control of AR/VR Near-Eye-Displays and AR-HUDs

Datum: 04.03.2021

Dr. Tobias Steinel


Ort: electronic displays Conference 2021 Digital

Novel display technologies for augmented and virtual reality (AR/VR/MR/XR) devices, like Head-Mounted-Devices and Head-Up-Displays, require advanced imaging systems and calibration to control quality during assembly to accurately match the real world and virtual objects. We demonstrate and compare advantages of goniometric sampling spot measurements and camera based imaging solutions.

Mehr Informationen

Characterization of VCSELs for 3D sensing applications according to the IEC60825-1 Standard

Datum: 18.01.2021

Dr. Katharina Predehl


Ort: Online Event

VCSELs have special properties in contrast to other typical laser sources. As a result, VCSEL eye safety evaluation is more complex and a couple of additional aspects have to be considered that would not apply for "normal" lasers. Consequently, the validation of a VCSEL's laser class is not trivial, and even more so because an easily understandable guideline for the assessment of VCSEL safety has not yet been published.


Methods to measure the luminous color of white and colored LEDs

Datum: 01.12.2020 – 01.12.2020

Dr. Hassan Gargouri


Ort: DVN Tokio 2020

Datum: 2. Dezember, 2020

Zeit: 17:15 (CET)


New LED calibration standards in the UV A/B/C range

Datum: 21.09.2020 – 24.09.2020

Dr. Đenan Konjhodžić

LpS Digital 2020


Eye safety of VCSEL arrays

Datum: 10.09.2020 – 10.09.2020


Ort: Dr. Katharina Predehl

China International Optoelectronic Exposition

IEEE OGC Conference

Virtuelles Event

Freitag 11. September, 2020


Proven solutions for testing μLED wafers, AR/VR Near-Eye displays and VCSEL arrays

Datum: 09.09.2020 – 09.09.2020

Collin Jiang


Ort: China International Optoelectronic Exposition

Photonics Germany @ CIOE 2020

Datum: 10. September, 2020

Zeit: 13:00 – 17:00 Shenzhen

Ort: World Exhibition & Convention Center ∙ Konferenzraum 2, Halle 1


Meeting Optical Testing Challenges of High-Resolution µLED-Displays

Datum: 05.08.2020 – 04.08.2020

Dr. Tobias Steinel

SID Display Week 2020, virtual event

Spatial Uniformity Display Measurement, Session 71.3

Donnerstag, 6. August 2020


Electro-optical transfer characteristic, the undervalued display feature

Datum: 05.08.2020 – 05.08.2020

Dr. Michael E. Becker

SID Display Week 2020, virtual event

Display Measurement Standards I, Session 50.3

Donnerstag, 6.August, 2020


End-of-line (EOL) Testing of Recent OEM Display Quality Standards

Datum: 25.02.2020 – 25.02.2020

Dr. Silke Kirchner

edc 2020

Nürnberg, Deutschland

Mittwoch, 26. Februar 2020, 16:35 - 16:55 Uhr, Session 6 Display Glass & Measurements