Join Us at Display Week 2025 in San Jose
2025/05/12
Instrument Systems will be showcasing its latest innovations in display metrology at Display Week 2025, taking place May 11–16 in San Jose. Visit us at Booth #1040 in the German Pavilion and discover our high-precision solutions for μ(O)LED and wafer-level testing, AR/VR/MR system evaluation and automotive display measurements.
A special highlight at the booth is our DMS 100, which enables fast, multi-angle goniometric characterization of displays. You can even test your own phone’s screen live at the booth!
We’re also contributing to the technical program:
- May 14 | 09:40 AM | Room LL21AB
Dr. Michael E. Becker (Author), Dr. Tobias Steinel (co-author & presenter) – Matched Moving-Window Averaging Filter - May 15 | 04:30 PM | Room 220A
Dr. Sascha Reinhardt – Multi-Reference Imaging Light Measurement Device.
We look forward to seeing you in San Jose!
