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News

News

Introducing the New LumiTop M150: High-Resolution Imaging Colorimeter for MicroLED Characterization

The new LumiTop M150 combines 151 MP imaging with spectral referencing for detailed characterization of microLED displays, microdisplays, wafers and optical…

Events

Events

Consumer Electronics Test & Development Summit

날짜: 2027/02/02 – 2027/02/03
장소: NLND Berlin, Germany

Meet Instrument Systems at the Consumer Electronics Test & Development Summit 2027 in Berlin! Discover our optical measurement solutions at Booth 422.

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Technical Articles

Article

High Accuracy Optical Metrology for MicroLED Displays and Wafers

MicroLED mass production demands both speed and accuracy. In this article, Dr. Tobias Steinel presents a novel metrology approach that merges high-resolution…

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Talks

Talk

Light metrology of microLED arrays for optical interconnects

날짜: 2027/02/03 – 2027/02/03, 06:00 PM (PST)

Dr. Sascha Reinhardt

Press Releases

Press

Instrument Systems expands NVIS display measurement portfolio according to MIL-STD-3009

Instrument Systems presents its portfolio of measurement solutions for night-vision-compatible lighting and displays according to MIL-STD-3009. These solutions…

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Newsletter

Letter

MicroLED Insights, Color Measurement Updates & Upcoming Events

From new perspectives on MicroLED metrology to more precise color evaluation, discover the latest insights and developments from Instrument Systems. Watch our…

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