Datum: 02.04.2023, 17:10 Uhr (GMT+8)
Dr. Tobias Steinel
Ort: ICDT / online
Session 24.3 Invited Paper
The upcoming μLED display technology promises high contrast, fast response time, wide color gamut, low power consumption, and long lifetime.
But, the technology is challenging for optical quality control, especially for narrow bandwidth μLEDs.
In his talk, Dr. Tobias Steinel, product manager at Instrument Systems, gives insights into the validation of a software method to find, locate and analyze single emitters on a wafer or display image. Emphasis lies on the extremely fast analysis algorithm that provides optical metrological parameter for every single emitter.