Introducing the New LumiTop M150: High-Resolution Imaging Colorimeter for MicroLED Characterization

As microLED pixels become smaller and emitter arrays more complex, precise spatial and colorimetric measurements are essential for development and quality control. With the new LumiTop M150, Instrument Systems introduces a high-resolution imaging colorimeter for the characterization of microLED displays, microdisplays and wafers.

Combining a 151-megapixel RGB camera with microscope optics and simultaneous spectral referencing using a CAS 140D spectroradiometer, the LumiTop M150 enables detailed analysis of individual emitters across large arrays. Engineers can evaluate luminance, chromaticity, emitter position and size, as well as spatial uniformity and defects.

Interchangeable microscope optics with magnification options of 4.5×, 11.25× and 18× allow the field of view and spatial resolution to be adapted to the device under test. Simultaneous spectral referencing supports accurate colorimetric evaluation, particularly for narrowband microLED emission.

Designed for flexible integration, the LumiTop M150 can be used as a standalone imaging colorimeter or integrated into automated measurement systems, including DMS goniometers. In addition to microLED displays, microdisplays and wafer-level testing, the system offers measurement possibilities for emerging optical interconnect applications, including co-packaged optics (CPO) and near-packaged optics (NPO), depending on the measurement configuration.

Learn more about the LumiTop M150.