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最前沿显示器的单像素计量法 (Single Pixel Metrology of Cutting Edge Displays)

Dr. Cameron Hughes

SID China 春季线上技术研讨会 — 显示测量和显示视觉专场

2020 年 5 月 16 日 16:25-16:45 (北京时间)

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Meeting Optical Testing Challenges of High-Resolution µLED-Displays

Dr. Tobias Steinel

SID Display Week 2020

San Jose Mc Enery Convention Center, Room LL20BC

Thursday, August 6, 2020, 03:10 PM - 04:30 PM

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Electro-optical transfer characteristic, the undervalued display feature

Dr. Michael E. Becker

SID Display Week 2020

San Francisco Moscone Convention Center, Room 209/210

Thursday, June 11, 2020, 9:00 AM - 10:20 AM

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Single pixel metrology of µ-LED displays

Dr. Martin Wolf

edc 2020

Nuremberg, Germany

Thursday, 27 February 2020, 14:15 - 14:35, Session 13

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High-fidelity imaging vs. artistic image rendering

Dr. Michael E. Becker

edc 2020

Nuremberg, Germany

Thursday, 27 February 2020, 11:00 - 11:20, Session 11

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End-of-line (EOL) Testing of Recent OEM Display Quality Standards

Dr. Silke Kirchner

edc 2020

Nuremberg, Germany

Wednesday, 26 February 2020, 16:35 - 16:55, Session 6 Display Glass & Measurements

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2019

Light Measurement Device For Subpixel Evaluation Of Micro-LED And OLED Displays

Dr. Tobias Steinel

SSL China 2019

Tuesday November 26, 2019 11:40am

Shenzhen Convention and Exhibition Center (5th Floor Peony Hall), China

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Characterization of Blue Light Hazard

Dr. Ðenan Konjhodžić

Lux et Color Vesprimiensis

Völgyikút Ház, Veszprém, Ungarn

Thursday, 10 Oktober 2019, 5:20 pm

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An Evaluation Guide for Blue Light Hazard

Dr. Ðenan Konjhodžić

LED professional Symposium + Expo

Seestudio, Opera House Bregenz, Austria

Thursday, 26 September 2019, 11:30-12:00 am

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End-Of-Line Testing of Recent Display Quality Standards

Dr. Silke R. Kirchner

SID Vehicle Displays and Interfaces 2019

Burton Manor Conference Center, Livonia, MI, USA

Wednesday, 25 September 2019, 9:15 – 9:35 am, Session 5.4

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Ultra high resolution imaging light measurement device for subpixel metrology of micro-LEDs and OLEDs

J.Blanke, T.Steinel, M.Wolf

EuroDisplay 2019

Minsk, Belarus, Stork Room 1, O-43

Thursday, 19 September 2019, 10:05 am, Session 7

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Evaluation of Blue Light Hazard

Dr. Ðenan Konjhodžić

CIE 2019 29th Quadrennial Session

Washington DC, USA

Tuesday, 18 June 2019, 09:20-10:20 am, Session PA3-2

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Flicker from Electronic Displays: Reconsidering the Confusion

Dr. Michael E. Becker

SID Display Week

San Francisco Moscone Center, CA, USA, Room LL20A

Session 50.1, Co-Chair: Jürgen Neumeier (Instrument Systems GmbH)

Thursday, 16 May 2019, 09:00-10:20 am

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Metrological Challenges of Non-Planar Displays

Andreas Kreisel

ICDT International Conference on Display Technology 2019

Kunshan, Suzhou, China

Thursday, 28 March 2019, 5:40 -6:00 pm

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