講演
講演会のご案内 – Our Experts Live

Two-dimensional LIV and beam quality characterization of individual emitters in a VCSEL array
日付: 2023/06/28, 08:40 (GMT+2)
Dr. Amir Sharghi
場所: SPIE Digital Optical Technologies, Munich/ Germany

High-throughput MicroLED Wafer Testing
日付: 2023/07/04
Dr. Tobias Steinel
場所: online
過去の講演会

Rapid Testing of μLEDs and Microdisplays on Wafer
日付: 2023/04/02, 17:10 (GMT+8)
Dr. Tobias Steinel
場所: ICDT / online

Characterization and Prevention of Global and Rolling Shutter Artefacts in Display Metrology
日付: 2023/03/15, 16:10 (GMT+1)
Andreas Liebel
場所: electronic displays conference, Nuremberg/Germany

Validating distortion measurements of wide-field-of-view near-eye displays
日付: 2023/01/30 – 2023/02/01, 18:00 (GMT -8)
Dr. Tobias Steinel
場所: SPIE AR|VR|MR , San Francisco/CA, USA

Comprehensive Extended Reality Test and Audit Solutions
日付: 2022/11/17, 16:00 (GMT +8)
Dr. Tobias Steinel
場所: CIOE (online)

New High resolution Infrared Array spectrometer CAS 140D IR
日付: 2022/11/08, 16:00 (CET)
Claudia Dippold
場所: online

Fast 2D Display Testing with Spectrally Corrected Colorimeters
日付: 2022/09/27, 11:40 (EST)
Justin Blanke
場所: Detroit/MI, USA

VCSEL Characterization: LiDAR and Eye-Safety Testing
日付: 2022/09/27, 12:00 (EST)
Justin Blanke
場所: Detroit/MI, USA

Comprehensive Extended Reality Test and Audit Solutions for Near-Eye Displays, Headset Infrared Light Sources and Optical Components
日付: 2022/09/20, 09:30 (EST)
Dr. Tobias Steinel
場所: online

Uniformity of OLED Displays at Ultra Low Luminance
日付: 2022/07/15 – 2022/07/18
Andreas Liebel
場所: ICDT/ online

Luminance Dependent Uniformity in OLED Displays
日付: 2022/06/21
Dr. Tobias Steinel
場所: electronic displays conference, Nuremberg

The importance of polarization characterization and eye safety assessment of VCSELs
日付: 2022/06/12
Dr. Karthik Iyer
場所: EPIC Online Technology Meeting

Spatially-resolved polarization characterization of VCSEL arrays
日付: 2022/01/26
Dr. Frank Münchow
場所: San Francisco/CA, USA

Sharpness and Contrast of AR/VR Near-Eye Displays: Goniometric vs. Advanced 2D Imaging Light Measurements of the Modulation Transfer Function (MTF)
日付: 2022/01/22 – 2022/01/24
Dr. Tobias Steinel
場所: San Francisco/CA, USA

One Shot: Polarization Characterization of VCSELs
日付: 2022/01/11 – 2022/01/11
場所: Online

AR/VR Near-Eye Displays: Meeting their Distinctive Challenges in Display Quality Control
日付: 2021/12/02
Dr. Cameron Hughes
場所: IDW'21 Virtual Conference

Nearfield VCSEL Testing Camera VTC 4000
日付: 2021/11/01
Dr. Karthik Iyer
場所: Virtual

Measurement systems in the UV A/B/C range
日付: 2021/07/31 – 2021/08/04 (on demand)
Dr. Ðenan Konjhodžić
場所: virtual | Optics + Photonics, San Diego/ California, USA

MicroLED Metrology: Challenges and Solutions
日付: 2021/05/31 (Beijing)
Dr. Tobias Steinel
場所: ICDT, Online / Beijing Etrong International Exhibition & Convention Center, Conference Hall 1, Meeting Room C

Color Uniformity of µLED Displays: New Color Calibration Concept for Fast and Accurate Optical Testing
日付: 2021/05/20
Dr. Tobias Steinel
場所: Display Week 2021 Virtual Conference

Short Course S-2: Fundamentals of Display Metrology
日付: 2021/05/19
Dr. Reto Häring in cooperation with Konica Minolta and Radiant Vision Systems
場所: Display Week 2021 Virtual Conference

Measurement systems and calibrations for UV radiation
日付: 2021/04/19
Dr. Ðenan Konjhodžić
場所: Online

Quality control of AR/VR near-eye-displays: Goniometric versus advanced 2D imaging light measurements
日付: 2021/03/27 – 2021/03/29
Dr. Tobias Steinel
場所: SPIE AR/VR/MR, Live on Demand, Conference 11765-36

Human-Centric Quality Control of AR/VR Near-Eye-Displays and AR-HUDs
日付: 2021/03/04
Dr. Tobias Steinel
場所: electronic displays Conference 2021 digital

Characterization of VCSELs for 3D sensing applications according to the IEC60825-1 Standard
日付: 2021/01/18
Dr. Katharina Predehl
場所: Online Event

Methods to measure the luminous color of white and colored LEDs
日付: 2020/12/01 – 2020/12/01
Dr. Hassan Gargouri
場所: DVN Tokyo 2020

New LED calibration standards in the UV A/B/C range
日付: 2020/09/21 – 2020/09/24
Dr. Đenan Konjhodžić

Eye safety of VCSEL arrays
日付: 2020/09/10 – 2020/09/10
場所: Dr. Katharina Predehl

Proven solutions for testing μLED wafers, AR/VR Near-Eye displays and VCSEL arrays
日付: 2020/09/09 – 2020/09/09
Collin Jiang
場所: China International Optoelectronic Exposition

Meeting Optical Testing Challenges of High-Resolution µLED-Displays
日付: 2020/08/05 – 2020/08/04
Dr. Tobias Steinel

Electro-optical transfer characteristic, the undervalued display feature
日付: 2020/08/05 – 2020/08/05
Dr. Michael E. Becker

End-of-line (EOL) Testing of Recent OEM Display Quality Standards
日付: 2020/02/25 – 2020/02/25
Dr. Silke Kirchner