講演

講演会のご案内 – Our Experts Live

過去の講演会

2022
2022_tst_cioe.png

Comprehensive Extended Reality Test and Audit Solutions

日付: 2022/11/17, 16:00 (GMT +8)

Dr. Tobias Steinel

 

場所: CIOE (online)

Visible and infrared light measurement devices (LMDs) are essential tools for developing novel extended reality display and sensing technologies as well as for quality assurance in the display and headset mass production. Extended reality devices come with a multitude of test requirements and the need to measure the same way as the human eye sees, and also might require different LMDs in the development and production phases.

もっと見る
2022_CDI_Epic_NPI.png

New High resolution Infrared Array spectrometer CAS 140D IR

日付: 2022/11/08, 16:00 (CET)

Claudia Dippold

 

場所: online

In this EPIC Members New Product Release, our Product Manager Claudia Dippold will introduce Instrument Systems' latest CAS 140D IR spectroradiometer for measurements in the infrared range. It features the proven high measurement accuracy and reliability of the CAS140D series, recognized all over the world as a reference for wavelengths from 780–1700 nm. Compared to its predecessor model, the new CAS 140D IR offers significantly improved performance in signal sensitivity, stray light suppression and electronics.

もっと見る
2022_SID_Vehicle_Displays_1.png

Fast 2D Display Testing with Spectrally Corrected Colorimeters

日付: 2022/09/27, 11:40 (EST)

Justin Blanke

 

場所: Detroit/MI, USA

Displays are becoming more and more prevalent in the automotive cabin and must serve a variety of functions flawlessly in a challenging environment. Specialized analysis to measure effects such as Black Mura must be conducted according to established standards; this enables meaningful comparison between supplier and manufacturer.

もっと見る
2022_SID_Vehicle_Displays_1.png

VCSEL Characterization: LiDAR and Eye-Safety Testing

日付: 2022/09/27, 12:00 (EST)

Justin Blanke

 

場所: Detroit/MI, USA

Vertical-cavity surface-emitting lasers (VCSELs) perfectly fulfill the requirements for present and future 3D sensing applications. However, to operate VCSEL-based devices in public, the manufacturer must assure “eye safe” operation compliant with the IEC 60825-1 standard or national equivalents. As VCSELs exhibit special emission characteristics that differ from other laser sources, the safety assessment is more complex, and a practical guideline does not exist.

もっと見る
2022_tst_dscc-arvr.jpg

Comprehensive Extended Reality Test and Audit Solutions for Near-Eye Displays, Headset Infrared Light Sources and Optical Components

日付: 2022/09/20, 09:30 (EST)

Dr. Tobias Steinel

 

場所: online

Visible and infrared light measurement devices (LMDs) are essential tools for developing novel extended reality display and sensing technologies as well as for quality assurance in the display and headset mass production. Extended reality devices come with a multitude of test requirements and the need to measure the same way as the human eye sees, and also might require different LMDs in the development and production phases.

もっと見る
2022_ali_icdt.png

Uniformity of OLED Displays at Ultra Low Luminance

日付: 2022/07/15 – 2022/07/18

Andreas Liebel

 

場所: ICDT/ online

Next generation OLEDs displays have in principle endless contrast ratios due to their emittive nature. However, in practice OLED displays show non-uniformities at very low luminance which have to be measured and corrected in order to maintain constant contrast.

In this presentation, uniformity measurements at very low luminance will be presented and results from displays from a variety of manufacturers will be compared.

もっと見る
2022_tst_edc.png

Luminance Dependent Uniformity in OLED Displays

日付: 2022/06/21

Dr. Tobias Steinel

 

場所: electronic displays conference, Nuremberg

Next generation OLEDs displays have in principle endless contrast ratios due to their emittive nature and their ability to completely turn off pixels. This makes them ideal in applications that require low display luminance like use in dark/nighttime conditions.

もっと見る
2022_kiy_epic.png

The importance of polarization characterization and eye safety assessment of VCSELs

日付: 2022/06/12

Dr. Karthik Iyer

 

場所: EPIC Online Technology Meeting

Novel VCSEL arrays require spatial testing of the whole ensemble as well as of the single emitters in the near-field. Such optical measurements must be calibrated, corrected for polarization dependency and traceable to ensure minimum error budgets for eye safety evaluation.

もっと見る
2022_fmu_pw.png

Spatially-resolved polarization characterization of VCSEL arrays

日付: 2022/01/26

Dr. Frank Münchow

 

場所: San Francisco/CA, USA

Although VCSELs are intrinsically single-longitudinal mode devices, they usually show complex polarization characteristics. Most VCSEL are not designed to emit in a single polarization state, there is no control about the polarization angle. The light emitted by the VCSEL typically show a complicated polarization, even within one emitter and abrupt polarization switching can be observed when temperature or bias current is changed. In this presentation we show a method of measuring spatially resolved polarization characteristics of VCSELs. This is achieved using a combination of polarization filtered microscope optics and a CMOS camera.

もっと見る
2022_tst_pw.jpg

Sharpness and Contrast of AR/VR Near-Eye Displays: Goniometric vs. Advanced 2D Imaging Light Measurements of the Modulation Transfer Function (MTF)

日付: 2022/01/22 – 2022/01/24

Dr. Tobias Steinel

 

場所: San Francisco/CA, USA

Novel display technologies for AR/VR/MR devices require distinct tests to control quality during development and in production. Sharpness and contrast tests are particularly important due to the complex overlay of real and augmented images. Clear and immersive perception of the augmented or virtual reality requires optimal optical differentiation between different display contents. Typically, the modulation transfer function (MTF) acts a measure for sharpness and contrast. For accurate MTF measurement, an imaging test system should be based on a lens system that mimics the human eye system and have a similar-sized entrance pupil in front of the lens.

もっと見る
2022_kiy_psc.jpg

One Shot: Polarization Characterization of VCSELs

日付: 2022/01/11 – 2022/01/11

 

場所: Online

VCSEL-based sensor technology supports innovative applications. As VCSELs have special properties, in contrast to other typical laser sources, their characterization is more complex.

もっと見る
2021
2021_chu_idw.jpg

AR/VR Near-Eye Displays: Meeting their Distinctive Challenges in Display Quality Control

日付: 2021/12/02

Dr. Cameron Hughes

 

場所: IDW'21 Virtual Conference

Near-eye displays (NEDs) exhibit a number of effects including distortion and sharpness distribution due to the optics that generate the virtual image. In his lecture, Dr. Cameron Hughes presents why a spectrally enhanced camera based system such as the LumiTop is ideal for fast and accurate production testing of these displays.

もっと見る
KW43_EPIC_Product_launch.jpg

Nearfield VCSEL Testing Camera VTC 4000

日付: 2021/11/01

Dr. Karthik Iyer

 

場所: Virtual

During the EPIC Members New Product Release, Instrument Systems' Program Manager Dr. Karthik Iyer presented our Nearfield VCSEL Testing Camera – VTC 4000.

もっと見る
2021_dko_optics_photonics.jpg

Measurement systems in the UV A/B/C range

日付: 2021/07/31 – 2021/08/04 (on demand)

Dr. Ðenan Konjhodžić

 

場所: virtual | Optics + Photonics, San Diego/ California, USA

Nowadays, the pandemic situation caused by the COVID-19 virus inspired many companies, research institutes and lighting designers to adopt UV radiation as a new tool in their projects and research. The promising germicidal effect of the UVC radiation also on the Coronavirus raises the question of the reliable measurement of the UV radiation. However, this complex task needs an expertise and appropriate equipment.

もっと見る
2021_tst_icdt.jpg

MicroLED Metrology: Challenges and Solutions

日付: 2021/05/31 (Beijing)

Dr. Tobias Steinel

 

場所: ICDT, Online / Beijing Etrong International Exhibition & Convention Center, Conference Hall 1, Meeting Room C

The upcoming μLED display technology promises high contrast, fast response time, wide color gamut, low power consumption, and long lifetime. However, the technology is not only challenging for mass transfer of the µLEDs from wafer to display, but also for massive parallelization of optical quality control at different manufacturing steps.

もっと見る
2021_tst_sid.jpg

Color Uniformity of µLED Displays: New Color Calibration Concept for Fast and Accurate Optical Testing

日付: 2021/05/20

Dr. Tobias Steinel

 

場所: Display Week 2021 Virtual Conference

Superior properties of µLEDs for display applications challenge metrology with, e.g, narrow emission bandwidth and enormous wavelength variability depending on their electronic driving parameters. Therefore, we developed new imaging test solutions to make color uniformity measurements fast and highly accurate even for strongly varying spectral properties of µLEDs.

もっと見る
2021_rha_sid.jpg

Short Course S-2: Fundamentals of Display Metrology

日付: 2021/05/19

Dr. Reto Häring in cooperation with Konica Minolta and Radiant Vision Systems

 

場所: Display Week 2021 Virtual Conference

This short course will provide a fundamental understanding of display metrology and introduce measurement equipment and techniques. It is held in cooperation with Konica Minolta and Radiant Vision Systems.

もっと見る
2021_dko_iculta.jpg

Measurement systems and calibrations for UV radiation

日付: 2021/04/19

Dr. Ðenan Konjhodžić

 

場所: Online

Nowadays, the pandemic situation caused by the COVID-19 virus inspired many companies, research institutes and lighting designers to adopt UV radiation as a new tool in their projects and research. The promising germicidal effect of the UVC radiation also on the Coronavirus raises the question of the reliable measurement of the UV radiation. However, this complex task needs an expertise and appropriate equipment.

More about the abstract
2021_tst_spie.png

Quality control of AR/VR near-eye-displays: Goniometric versus advanced 2D imaging light measurements

日付: 2021/03/27 – 2021/03/29

Dr. Tobias Steinel

 

場所: SPIE AR/VR/MR, Live on Demand, Conference 11765-36

Novel display technologies for AR/VR/MR devices require advanced imaging systems to control quality during assembly and to calibrate the device. Such calibration yields an optimal match of left and right eye and allows color management for an accurate match of real world and virtual objects. For accurate measurement, such an imaging system should be based on a lens system that mimics the human eye system and have a similar-sized entrance pupil in front of the lens. Traditionally two approaches have been proposed:

Read the abstract
2021_tst_edc.png

Human-Centric Quality Control of AR/VR Near-Eye-Displays and AR-HUDs

日付: 2021/03/04

Dr. Tobias Steinel

 

場所: electronic displays Conference 2021 digital

Novel display technologies for augmented and virtual reality (AR/VR/MR/XR) devices, like Head-Mounted-Devices and Head-Up-Displays, require advanced imaging systems and calibration to control quality during assembly to accurately match the real world and virtual objects. We demonstrate and compare advantages of goniometric sampling spot measurements and camera based imaging solutions.

More information
2021_kpr_PhotonicsSpectraConference.jpg

Characterization of VCSELs for 3D sensing applications according to the IEC60825-1 Standard

日付: 2021/01/18

Dr. Katharina Predehl

 

場所: Online Event

VCSELs have special properties in contrast to other typical laser sources. As a result, VCSEL eye safety evaluation is more complex and a couple of additional aspects have to be considered that would not apply for "normal" lasers. Consequently, the validation of a VCSEL's laser class is not trivial, and even more so because an easily understandable guideline for the assessment of VCSEL safety has not yet been published.

もっと見る
2020
2020_hga_dvn.png

Methods to measure the luminous color of white and colored LEDs

日付: 2020/12/01 – 2020/12/01

Dr. Hassan Gargouri

 

場所: DVN Tokyo 2020

Date: December 2, 2020

Time: 17:15 (CET)

もっと見る
2019_dko.jpg

New LED calibration standards in the UV A/B/C range

日付: 2020/09/21 – 2020/09/24

Dr. Đenan Konjhodžić

LpS Digital 2020

もっと見る
2020_kpr_cioe.png

Eye safety of VCSEL arrays

日付: 2020/09/10 – 2020/09/10

 

場所: Dr. Katharina Predehl

China International Optoelectronic Exposition

IEEE OGC Conference

Virtual Event

Friday, September 11, 2020

もっと見る
Collin_CIOE.jpg

Proven solutions for testing μLED wafers, AR/VR Near-Eye displays and VCSEL arrays

日付: 2020/09/09 – 2020/09/09

Collin Jiang

 

場所: China International Optoelectronic Exposition

Photonics Germany @ CIOE 2020

Date: September 10, 2020

Time: 1 pm – 5 pm Shenzhen

Location: World Exhibition & Convention Center ∙ Conference Room 2, Hall 1

もっと見る
2020_tst_sid.jpg

Meeting Optical Testing Challenges of High-Resolution µLED-Displays

日付: 2020/08/05 – 2020/08/04

Dr. Tobias Steinel

SID Display Week 2020, virtual event

Spatial Uniformity Display Measurement, Session 71.3

Thursday, August 6, 2020

もっと見る
2019_mbe_sid.jpg

Electro-optical transfer characteristic, the undervalued display feature

日付: 2020/08/05 – 2020/08/05

Dr. Michael E. Becker

SID Display Week 2020, virtual event

Display Measurement Standards I, Session 50.3

Thursday, August 6, 2020

もっと見る
2020_skr_edc.jpg

End-of-line (EOL) Testing of Recent OEM Display Quality Standards

日付: 2020/02/25 – 2020/02/25

Dr. Silke Kirchner

edc 2020

Nuremberg, Germany

Wednesday, 26 February 2020, 16:35 - 16:55, Session 6 Display Glass & Measurements

もっと見る