Lectures

2022

Comprehensive Extended Reality Test and Audit Solutions

Date: 2022/11/17, 04:00 PM (GMT +8)

Dr. Tobias Steinel

 

Location: CIOE (online)

Visible and infrared light measurement devices (LMDs) are essential tools for developing novel extended reality display and sensing technologies as well as for quality assurance in the display and headset mass production. Extended reality devices come with a multitude of test requirements and the need to measure the same way as the human eye sees, and also might require different LMDs in the development and production phases.

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New High resolution Infrared Array spectrometer CAS 140D IR

Date: 2022/11/08, 04:00 PM (CET)

Claudia Dippold

 

Location: online

In this EPIC Members New Product Release, our Product Manager Claudia Dippold will introduce Instrument Systems' latest CAS 140D IR spectroradiometer for measurements in the infrared range. It features the proven high measurement accuracy and reliability of the CAS140D series, recognized all over the world as a reference for wavelengths from 780–1700 nm. Compared to its predecessor model, the new CAS 140D IR offers significantly improved performance in signal sensitivity, stray light suppression and electronics.

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Fast 2D Display Testing with Spectrally Corrected Colorimeters

Date: 2022/09/27, 11:40 AM (EST)

Justin Blanke

 

Location: Detroit/MI, USA

Displays are becoming more and more prevalent in the automotive cabin and must serve a variety of functions flawlessly in a challenging environment. Specialized analysis to measure effects such as Black Mura must be conducted according to established standards; this enables meaningful comparison between supplier and manufacturer.

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VCSEL Characterization: LiDAR and Eye-Safety Testing

Date: 2022/09/27, 12:00 PM (EST)

Justin Blanke

 

Location: Detroit/MI, USA

Vertical-cavity surface-emitting lasers (VCSELs) perfectly fulfill the requirements for present and future 3D sensing applications. However, to operate VCSEL-based devices in public, the manufacturer must assure “eye safe” operation compliant with the IEC 60825-1 standard or national equivalents. As VCSELs exhibit special emission characteristics that differ from other laser sources, the safety assessment is more complex, and a practical guideline does not exist.

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Comprehensive Extended Reality Test and Audit Solutions for Near-Eye Displays, Headset Infrared Light Sources and Optical Components

Date: 2022/09/20, 09:30 AM (EST)

Dr. Tobias Steinel

 

Location: online

Visible and infrared light measurement devices (LMDs) are essential tools for developing novel extended reality display and sensing technologies as well as for quality assurance in the display and headset mass production. Extended reality devices come with a multitude of test requirements and the need to measure the same way as the human eye sees, and also might require different LMDs in the development and production phases.

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Uniformity of OLED Displays at Ultra Low Luminance

Date: 2022/07/15 – 2022/07/18

Andreas Liebel

 

Location: ICDT/ online

Next generation OLEDs displays have in principle endless contrast ratios due to their emittive nature. However, in practice OLED displays show non-uniformities at very low luminance which have to be measured and corrected in order to maintain constant contrast.

In this presentation, uniformity measurements at very low luminance will be presented and results from displays from a variety of manufacturers will be compared.

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Luminance Dependent Uniformity in OLED Displays

Date: 2022/06/21

Dr. Tobias Steinel

 

Location: electronic displays conference, Nuremberg

Next generation OLEDs displays have in principle endless contrast ratios due to their emittive nature and their ability to completely turn off pixels. This makes them ideal in applications that require low display luminance like use in dark/nighttime conditions.

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The importance of polarization characterization and eye safety assessment of VCSELs

Date: 2022/06/12

Dr. Karthik Iyer

 

Location: EPIC Online Technology Meeting

Novel VCSEL arrays require spatial testing of the whole ensemble as well as of the single emitters in the near-field. Such optical measurements must be calibrated, corrected for polarization dependency and traceable to ensure minimum error budgets for eye safety evaluation.

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Spatially-resolved polarization characterization of VCSEL arrays

Date: 2022/01/26

Dr. Frank Münchow

 

Location: San Francisco/CA, USA

Although VCSELs are intrinsically single-longitudinal mode devices, they usually show complex polarization characteristics. Most VCSEL are not designed to emit in a single polarization state, there is no control about the polarization angle. The light emitted by the VCSEL typically show a complicated polarization, even within one emitter and abrupt polarization switching can be observed when temperature or bias current is changed. In this presentation we show a method of measuring spatially resolved polarization characteristics of VCSELs. This is achieved using a combination of polarization filtered microscope optics and a CMOS camera.

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Sharpness and Contrast of AR/VR Near-Eye Displays: Goniometric vs. Advanced 2D Imaging Light Measurements of the Modulation Transfer Function (MTF)

Date: 2022/01/22 – 2022/01/24

Dr. Tobias Steinel

 

Location: San Francisco/CA, USA

Novel display technologies for AR/VR/MR devices require distinct tests to control quality during development and in production. Sharpness and contrast tests are particularly important due to the complex overlay of real and augmented images. Clear and immersive perception of the augmented or virtual reality requires optimal optical differentiation between different display contents. Typically, the modulation transfer function (MTF) acts a measure for sharpness and contrast. For accurate MTF measurement, an imaging test system should be based on a lens system that mimics the human eye system and have a similar-sized entrance pupil in front of the lens.

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One Shot: Polarization Characterization of VCSELs

Date: 2022/01/11 – 2022/01/11

 

Location: Online

VCSEL-based sensor technology supports innovative applications. As VCSELs have special properties, in contrast to other typical laser sources, their characterization is more complex.

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2021

AR/VR Near-Eye Displays: Meeting their Distinctive Challenges in Display Quality Control

Date: 2021/12/02

Dr. Cameron Hughes

 

Location: IDW'21 Virtual Conference

Near-eye displays (NEDs) exhibit a number of effects including distortion and sharpness distribution due to the optics that generate the virtual image. In his lecture, Dr. Cameron Hughes presents why a spectrally enhanced camera based system such as the LumiTop is ideal for fast and accurate production testing of these displays.

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Nearfield VCSEL Testing Camera VTC 4000

Date: 2021/11/01

Dr. Karthik Iyer

 

Location: Virtual

During the EPIC Members New Product Release, Instrument Systems' Program Manager Dr. Karthik Iyer presented our Nearfield VCSEL Testing Camera – VTC 4000.

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Measurement systems in the UV A/B/C range

Date: 2021/07/31 – 2021/08/04 (on demand)

Dr. Ðenan Konjhodžić

 

Location: virtual | Optics + Photonics, San Diego/ California, USA

Nowadays, the pandemic situation caused by the COVID-19 virus inspired many companies, research institutes and lighting designers to adopt UV radiation as a new tool in their projects and research. The promising germicidal effect of the UVC radiation also on the Coronavirus raises the question of the reliable measurement of the UV radiation. However, this complex task needs an expertise and appropriate equipment.

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MicroLED Metrology: Challenges and Solutions

Date: 2021/05/31 (Beijing)

Dr. Tobias Steinel

 

Location: ICDT, Online / Beijing Etrong International Exhibition & Convention Center, Conference Hall 1, Meeting Room C

The upcoming μLED display technology promises high contrast, fast response time, wide color gamut, low power consumption, and long lifetime. However, the technology is not only challenging for mass transfer of the µLEDs from wafer to display, but also for massive parallelization of optical quality control at different manufacturing steps.

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Color Uniformity of µLED Displays: New Color Calibration Concept for Fast and Accurate Optical Testing

Date: 2021/05/20

Dr. Tobias Steinel

 

Location: Display Week 2021 Virtual Conference

Superior properties of µLEDs for display applications challenge metrology with, e.g, narrow emission bandwidth and enormous wavelength variability depending on their electronic driving parameters. Therefore, we developed new imaging test solutions to make color uniformity measurements fast and highly accurate even for strongly varying spectral properties of µLEDs.

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Short Course S-2: Fundamentals of Display Metrology

Date: 2021/05/19

Dr. Reto Häring in cooperation with Konica Minolta and Radiant Vision Systems

 

Location: Display Week 2021 Virtual Conference

This short course will provide a fundamental understanding of display metrology and introduce measurement equipment and techniques. It is held in cooperation with Konica Minolta and Radiant Vision Systems.

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Measurement systems and calibrations for UV radiation

Date: 2021/04/19

Dr. Ðenan Konjhodžić

 

Location: Online

Nowadays, the pandemic situation caused by the COVID-19 virus inspired many companies, research institutes and lighting designers to adopt UV radiation as a new tool in their projects and research. The promising germicidal effect of the UVC radiation also on the Coronavirus raises the question of the reliable measurement of the UV radiation. However, this complex task needs an expertise and appropriate equipment.

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Quality control of AR/VR near-eye-displays: Goniometric versus advanced 2D imaging light measurements

Date: 2021/03/27 – 2021/03/29

Dr. Tobias Steinel

 

Location: SPIE AR/VR/MR, Live on Demand, Conference 11765-36

Novel display technologies for AR/VR/MR devices require advanced imaging systems to control quality during assembly and to calibrate the device. Such calibration yields an optimal match of left and right eye and allows color management for an accurate match of real world and virtual objects. For accurate measurement, such an imaging system should be based on a lens system that mimics the human eye system and have a similar-sized entrance pupil in front of the lens. Traditionally two approaches have been proposed:

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Human-Centric Quality Control of AR/VR Near-Eye-Displays and AR-HUDs

Date: 2021/03/04

Dr. Tobias Steinel

 

Location: electronic displays Conference 2021 digital

Novel display technologies for augmented and virtual reality (AR/VR/MR/XR) devices, like Head-Mounted-Devices and Head-Up-Displays, require advanced imaging systems and calibration to control quality during assembly to accurately match the real world and virtual objects. We demonstrate and compare advantages of goniometric sampling spot measurements and camera based imaging solutions.

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Characterization of VCSELs for 3D sensing applications according to the IEC60825-1 Standard

Date: 2021/01/18

Dr. Katharina Predehl

 

Location: Online Event

VCSELs have special properties in contrast to other typical laser sources. As a result, VCSEL eye safety evaluation is more complex and a couple of additional aspects have to be considered that would not apply for "normal" lasers. Consequently, the validation of a VCSEL's laser class is not trivial, and even more so because an easily understandable guideline for the assessment of VCSEL safety has not yet been published.

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2020

Methods to measure the luminous color of white and colored LEDs

Date: 2020/12/01 – 2020/12/01

Dr. Hassan Gargouri

 

Location: DVN Tokyo 2020

Date: December 2, 2020

Time: 17:15 (CET)

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New LED calibration standards in the UV A/B/C range

Date: 2020/09/21 – 2020/09/24

Dr. Đenan Konjhodžić

LpS Digital 2020

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Eye safety of VCSEL arrays

Date: 2020/09/10 – 2020/09/10

 

Location: Dr. Katharina Predehl

China International Optoelectronic Exposition

IEEE OGC Conference

Virtual Event

Friday, September 11, 2020

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Proven solutions for testing μLED wafers, AR/VR Near-Eye displays and VCSEL arrays

Date: 2020/09/09 – 2020/09/09

Collin Jiang

 

Location: China International Optoelectronic Exposition

Photonics Germany @ CIOE 2020

Date: September 10, 2020

Time: 1 pm – 5 pm Shenzhen

Location: World Exhibition & Convention Center ∙ Conference Room 2, Hall 1

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Meeting Optical Testing Challenges of High-Resolution µLED-Displays

Date: 2020/08/05 – 2020/08/04

Dr. Tobias Steinel

SID Display Week 2020, virtual event

Spatial Uniformity Display Measurement, Session 71.3

Thursday, August 6, 2020

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Electro-optical transfer characteristic, the undervalued display feature

Date: 2020/08/05 – 2020/08/05

Dr. Michael E. Becker

SID Display Week 2020, virtual event

Display Measurement Standards I, Session 50.3

Thursday, August 6, 2020

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End-of-line (EOL) Testing of Recent OEM Display Quality Standards

Date: 2020/02/25 – 2020/02/25

Dr. Silke Kirchner

edc 2020

Nuremberg, Germany

Wednesday, 26 February 2020, 16:35 - 16:55, Session 6 Display Glass & Measurements

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2019

Light Measurement Device For Subpixel Evaluation Of Micro-LED And OLED Displays

Date: 2019/11/25

Dr. Tobias Steinel

SSL China 2019

Tuesday November 26, 2019 11:40am

Shenzhen Convention and Exhibition Center (5th Floor Peony Hall), China

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Characterization of Blue Light Hazard

Date: 2019/10/09 – 2019/12/30

Dr. Ðenan Konjhodžić

Lux et Color Vesprimiensis

Völgyikút Ház, Veszprém, Ungarn

Thursday, 10 Oktober 2019, 5:20 pm

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An Evaluation Guide for Blue Light Hazard

Date: 2019/09/25 – 2019/12/30

Dr. Ðenan Konjhodžić

LED professional Symposium + Expo

Seestudio, Opera House Bregenz, Austria

Thursday, 26 September 2019, 11:30-12:00 am

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End-Of-Line Testing of Recent Display Quality Standards

Date: 2019/09/24 – 2019/12/30

Dr. Silke R. Kirchner

SID Vehicle Displays and Interfaces 2019

Burton Manor Conference Center, Livonia, MI, USA

Wednesday, 25 September 2019, 9:15 – 9:35 am, Session 5.4

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Ultra high resolution imaging light measurement device for subpixel metrology of micro-LEDs and OLEDs

Date: 2019/09/18 – 2019/12/30

J.Blanke, T.Steinel, M.Wolf

EuroDisplay 2019

Minsk, Belarus, Stork Room 1, O-43

Thursday, 19 September 2019, 10:05 am, Session 7

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Evaluation of Blue Light Hazard

Date: 2019/06/17 – 2019/12/30

Dr. Ðenan Konjhodžić

CIE 2019 29th Quadrennial Session

Washington DC, USA

Tuesday, 18 June 2019, 09:20-10:20 am, Session PA3-2

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Flicker from Electronic Displays: Reconsidering the Confusion

Date: 2019/05/15 – 2019/12/30

Dr. Michael E. Becker

SID Display Week

San Francisco Moscone Center, CA, USA, Room LL20A

Session 50.1, Co-Chair: Jürgen Neumeier (Instrument Systems GmbH)

Thursday, 16 May 2019, 09:00-10:20 am

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Metrological Challenges of Non-Planar Displays

Date: 2019/03/27 – 2019/12/30

Andreas Kreisel

ICDT International Conference on Display Technology 2019

Kunshan, Suzhou, China

Thursday, 28 March 2019, 5:40 -6:00 pm

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