Lectures
Live Colorimeter Calibration Adapts to Spectral Variations of Measurement Object
Date: 2024/04/10, 01:20 PM (GMT+1)
Dr. Tobias Steinel
Location: electronic displays conference, Nuremberg/ Germany
Matching One-Shot Imaging Light Measurement Devices with Goniophotometer Measurements in VR Applications
Date: 2024/04/10 – 2024/04/11
Dr. Sascha Reinhardt
Location: electronic displays conference, Nuremberg/ Germany
Characterization of Semiconductor Lasers at SWIR Wavelength
Date: 2024/04/11, 01:40 PM (GMT+1)
Dr. Amir Sharghi
Paper 13002-29
Location: Strasbourg, France
Fundamentals of Display Metrology
Date: 2024/05/12
Dr. Ferdinand Deger
Display Metrology Training Course in cooperation with Radiant Vision Systems
Location: Display Week, San José/CA, USA
Impact of Calibration Sources on Accuracy of Chromaticity Measurements
Date: 2024/05/16, 09:40 AM (GMT-8)
Dr. Tobias Steinel
Session 58.3
Location: Display Week, San José, CA/ USA
One-shot single-emitter-resolved polarization and LIV+λ characterization of a VCSEL array at tempered conditions
Date: 2024/01/31, 11:35 AM (GMT-8)
Dr. Amir Sharghi
Session 12904-11
Location: SPIE Photonics West, San Francisco/CA, USA
Safety Assessment of Virtual Reality eye tracking modules
Date: 2024/01/29, 03:30 PM (GMT-8)
Dr. Amir Sharghi
Session 12913-55
Location: SPIE AR|VR|MR, San Francisco/CA, USA
Light measurement and quality control at different production stages of a virtual reality headset
Date: 2024/01/29, 10:50 AM (GMT-8)
Dr. Tobias Steinel
Session 12913-45
Location: SPIE AR|VR|MR, San Francisco/ CA, USA
Rapid Testing of µLEDs and µDisplays on Wafer
Date: 2023/10/12, 03:30 PM (GMT+8)
Tianxing Zhu
Location: C-Touch & Displays, Shenzhen, China
Optical characterization of curved displays
Date: 2023/09/27, 02:20 AM (GMT-4)
Kevin Lange
Location: SID Vehicle Displays & Interfaces, Detroit/MI, USA
Light Measurement of VR devices
Date: 2023/09/13, 02:30 PM (CEST)
Dr. Sascha Reinhardt
Location: DSCC AR/VR Forum - online
Rapid Testing of µLEDs and Microdisplays on Wafer
Date: 2023/09/05, 11:10 AM (GMT+8)
Jack Hwang
Location: Micro LEDForum 2023, Taipei/ Taiwan
Massive Parallelization of Optical Quality Control of μLED Displays and Wafers
Date: 2023/07/06, 02:50 PM (GMT+2)
Dr. Tobias Steinel
Location: 2nd Focus Meeting of the DFF, Ittervoort/ Netherlands
High-throughput MicroLED Wafer Testing
Date: 2023/07/04, 11:30 AM (GMT+2)
Dr. Tobias Steinel
Location: online
Two-dimensional LIV and beam quality characterization of individual emitters in a VCSEL array
Date: 2023/06/28, 08:40 AM (GMT+2)
Dr. Amir Sharghi
Location: SPIE Digital Optical Technologies, Munich/ Germany
Rapid Testing of μLEDs and Microdisplays on Wafer
Date: 2023/04/02, 05:10 PM (GMT+8)
Dr. Tobias Steinel
Location: ICDT / online
Characterization and Prevention of Global and Rolling Shutter Artifacts in Display Metrology
Date: 2023/03/15, 04:10 PM (GMT+1)
Andreas Liebel
Location: electronic displays conference, Nuremberg/Germany
Validating distortion measurements of wide-field-of-view near-eye displays
Date: 2023/01/30 – 2023/02/01, 06:00 PM (GMT -8)
Dr. Tobias Steinel
Location: SPIE AR|VR|MR , San Francisco/CA, USA
Comprehensive Extended Reality Test and Audit Solutions
Date: 2022/11/17, 04:00 PM (GMT +8)
Dr. Tobias Steinel
Location: CIOE (online)
New High resolution Infrared Array spectrometer CAS 140D IR
Date: 2022/11/08, 04:00 PM (CET)
Claudia Dippold
Location: online
Fast 2D Display Testing with Spectrally Corrected Colorimeters
Date: 2022/09/27, 11:40 AM (EST)
Justin Blanke
Location: Detroit/MI, USA
VCSEL Characterization: LiDAR and Eye-Safety Testing
Date: 2022/09/27, 12:00 PM (EST)
Justin Blanke
Location: Detroit/MI, USA
Comprehensive Extended Reality Test and Audit Solutions for Near-Eye Displays, Headset Infrared Light Sources and Optical Components
Date: 2022/09/20, 09:30 AM (EST)
Dr. Tobias Steinel
Location: online
Uniformity of OLED Displays at Ultra Low Luminance
Date: 2022/07/15 – 2022/07/18
Andreas Liebel
Location: ICDT/ online
Luminance Dependent Uniformity in OLED Displays
Date: 2022/06/21
Dr. Tobias Steinel
Location: electronic displays conference, Nuremberg
The importance of polarization characterization and eye safety assessment of VCSELs
Date: 2022/06/12
Dr. Karthik Iyer
Location: EPIC Online Technology Meeting
Spatially-resolved polarization characterization of VCSEL arrays
Date: 2022/01/26
Dr. Frank Münchow
Location: San Francisco/CA, USA
Sharpness and Contrast of AR/VR Near-Eye Displays: Goniometric vs. Advanced 2D Imaging Light Measurements of the Modulation Transfer Function (MTF)
Date: 2022/01/22 – 2022/01/24
Dr. Tobias Steinel
Location: San Francisco/CA, USA
One Shot: Polarization Characterization of VCSELs
Date: 2022/01/11 – 2022/01/11
Location: Online
AR/VR Near-Eye Displays: Meeting their Distinctive Challenges in Display Quality Control
Date: 2021/12/02
Dr. Cameron Hughes
Location: IDW'21 Virtual Conference
Nearfield VCSEL Testing Camera VTC 4000
Date: 2021/11/01
Dr. Karthik Iyer
Location: Virtual
Measurement systems in the UV A/B/C range
Date: 2021/07/31 – 2021/08/04
Dr. Ðenan Konjhodžić
Location: virtual | Optics + Photonics, San Diego/ California, USA
MicroLED Metrology: Challenges and Solutions
Date: 2021/05/31
Dr. Tobias Steinel
Location: ICDT, Online / Beijing Etrong International Exhibition & Convention Center, Conference Hall 1, Meeting Room C
Color Uniformity of µLED Displays: New Color Calibration Concept for Fast and Accurate Optical Testing
Date: 2021/05/20
Dr. Tobias Steinel
Location: Display Week 2021 Virtual Conference
Short Course S-2: Fundamentals of Display Metrology
Date: 2021/05/19
Dr. Reto Häring in cooperation with Konica Minolta and Radiant Vision Systems
Location: Display Week 2021 Virtual Conference
Measurement systems and calibrations for UV radiation
Date: 2021/04/19
Dr. Ðenan Konjhodžić
Location: Online
Quality control of AR/VR near-eye-displays: Goniometric versus advanced 2D imaging light measurements
Date: 2021/03/27 – 2021/03/29
Dr. Tobias Steinel
Location: SPIE AR/VR/MR, Live on Demand, Conference 11765-36
Human-Centric Quality Control of AR/VR Near-Eye-Displays and AR-HUDs
Date: 2021/03/04
Dr. Tobias Steinel
Location: electronic displays Conference 2021 digital
Characterization of VCSELs for 3D sensing applications according to the IEC60825-1 Standard
Date: 2021/01/18
Dr. Katharina Predehl
Location: Online Event