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NEWS

欢迎莅临 2025 台湾国际雷射展（Laser & Photonics Taiwan）– 展位号 P1305！

2025 年 8 月 20–23 日，我们将携手合作伙伴方全有限公司亮相台北南港展览馆，展示光学与显示量测领域的最新技术成果。

展会活动

EVENTS

中国国际光电博览会（CIOE2025）

Date: 2025/09/10 – 2025/09/12
Location: 深圳国际会展中心（宝安新馆）

展馆: 3, 展位号: 3A40-9

技术文章

Article

Comparative Measurements of Near-Eye Displays Using a Goniophotometer and an Imaging Light Measuring Device

How can manufacturers ensure both accuracy and efficiency when testing near-eye displays (NEDs) for AR and VR devices? A new study published on Wiley Online…

专题演讲

Talk

High accuracy optical metrology for MicroLED displays and wafers

Date: 2025/09/25 – 2025/09/25, 13:30 (CEST)

Dr. Tobias Steinel

Location: Eindhoven, Netherlands

媒体发布

Press

High-end Metrology for an Excellent XR Experience

At SPIE AR|VR|MR 2025 and Photonics West 2025 in San Francisco, Instrument Systems will be presenting comprehensive solutions for optical quality control that…

电子快报

Letter

High-end Metrology for an excellent XR experience

Meet Instrument Systems in San Francisco this January at SPIE.AR|VR|MR and Photonics West. Discover our latest optical test solutions for AR/VR/XR displays – from…

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