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SpecWin Pro 5.0: Powerful Software Enhancements for precise Light Measurement

The release of SpecWin Pro 5.0 introduces a series of significant enhancements that further improve accuracy, flexibility, and efficiency in spectral light…

展会活动

EVENTS

SPIE.AR|VR|MR 2026

Date: 2026/01/17 – 2026/01/22
Location: San Francisco, CA/USA

欢迎莅临我们的 #6501 展位！

技术文章

Article

用于 MicroLED 显示与晶圆测试的光学测量方法

MicroLED 的量产对测试速度与测量准确性提出了更高要求。本文由 Tobias Steinel 博士介绍了一种新的光学测量方案，将高分辨率相机系统与实时光谱校正功能相结合，实现了单发光单元级的光谱测量，并在保持测量准确性的同时显著缩短了测试时间。

专题演讲

Talk

Impact of backgrounds on virtual image quality in AR glasses

Date: 2026/01/20 – 2026/01/20, 14:20 (GMT-7)

Dr. Sascha Reinhardt

Location: Moscone Center, San Francisco, CA/USA

媒体发布

Press

SpecWin Pro 5.0: New Major Software Release with Enhanced Modules and Optimized Device Integration

With SpecWin Pro 5.0, Instrument Systems expands the software for all their spectrometers with powerful new features: The release offers enhanced goniometer…

电子快报

Letter

Precision Meets Innovation: Your End‑of‑Year Edition

Stay ahead in optical metrology with our latest software updates, expert insights, and event news. In this issue, discover powerful new features in SpecWin Pro…

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