AMS Screen Imaging System: Our new application for SIA Vision Paris
Instrument Systems presents a newly developed system for ultra-fast testing a wide range of lighting scenarios for advanced headlamps, e.g. HD / ADB / matrix / pixel headlamps. The AMS screen imaging system consists of a far field goniometer, a screen photometer and an illuminance meter and allows synchronized measurements for luminance and far field on a high level of accuracy. Supported by the extended LightCon software, compliance checks according to ECE / SAE / ICAO / FAA regulations as well as extensive graphical analysis are efficient to perform.