Accelerated Optical Measurement Solutions with highest accuracy for MicroLED Displays and Wafers

In this presentation, Instrument Systems will explore the challenges and solutions associated with measuring and examining individual microLEDs on both displays and wafers.

We will emphasize high-resolution imaging systems for light measurement, specifically designed to meet production speed requirements, ensure photometric accuracy traceable to national standards, and adapt to various DUTs. 
The presentation will showcase measurements and analyses with single-emitter resolution, covering both electroluminescence and photoluminescence on displays and wafers. Additionally, attendees will get a glimpse of an upcoming mass production photoluminescence wafer testing system that incorporates Instrument Systems' measurement technology.