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News

News

Improved TOP 300 support in SpecWin Pro 5.0

SpecWin Pro 5.0, the standard software for all Instrument Systems spectrometers, now offers enhanced integration and support for the TOP 300 optical probe. …

Events

Events

SPIE.AR|VR|MR 2026

Date: 2026/01/17 – 2026/01/22
Location: San Francisco, CA/USA

Visit us at booth #6501!

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Technical Articles

Article

High Accuracy Optical Metrology for MicroLED Displays and Wafers

MicroLED mass production demands both speed and accuracy. In this article, Dr. Tobias Steinel presents a novel metrology approach that merges high-resolution…

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Talks

Talk

Impact of backgrounds on virtual image quality in AR glasses

Date: 2026/01/20 – 2026/01/20, 02:20 PM (GMT-7)

Dr. Sascha Reinhardt

Location: Moscone Center, San Francisco, CA/USA

Press Releases

Press

The new STA Stand‑Alone Screen Photometer for Fast, Vehicle‑based Headlamp Testing

Instrument Systems introduces the STA Stand‑Alone Screen Photometer — a modular, vehicle‑based measurement solution that combines the LumiCam 4000B imaging…

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Newsletter

Letter

Precision Meets Innovation: Your End‑of‑Year Edition

Stay ahead in optical metrology with our latest software updates, expert insights, and event news. In this issue, discover powerful new features in SpecWin Pro…

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