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News

News

10 Years of LumiSuite

Since its introduction in 2016, LumiSuite has evolved into a comprehensive software platform for display and near-eye display testing. Continuous development has…

Events

Events

SID Display Week 2026

Date: 2026/05/05 – 2026/05/07
Location: Los Angeles, USA

Discover advanced metrology solutions for near-eye display (NED) and Micro(O)LED applications, presented in collaboration with Konica Minolta and Radiant Vision Systems.Booth No. 845

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Technical Articles

Article

High Accuracy Optical Metrology for MicroLED Displays and Wafers

MicroLED mass production demands both speed and accuracy. In this article, Dr. Tobias Steinel presents a novel metrology approach that merges high-resolution…

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Talks

Talk

Multiple Color Matching Function 2D Colorimetry

Date: 2026/05/07 – 2026/05/07, 05:30 PM (UTC-7)

Andreas Liebel

Location: Los Angeles McEnery Convention Center, Concourse Hall

Press Releases

Press

Instrument Systems Appoints Dr. Marc Lünnemann as New CEO

Instrument Systems GmbH, a leading provider of high‑precision light measurement technology and part of the Konica Minolta Group, has appointed Dr. Marc Lünnemann…

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Newsletter

Letter

AR/VR Testing at ICDT, NVIS Solutions & Analysis Software

In Spring 2026, Instrument Systems will be active at several key industry events, presenting our latest solutions for display and near-eye display (NED) metrology.…

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