High-Speed, High-Accuracy Optical Metrology for µLED Displays and Wafers

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Date: 2024/12/05

Dr. Tobias Steinel

Location: Trendforce Micro LEDforum 2024, Taipei/ Taiwan


Instrument Systems will discuss the challenges and solutions of µLED metrology and analysis for every single µLED on displays and wafers. The focus is on high-resolution imaging light measurement devices optimized for mass production speed, photometric accuracy traceable to national standards, and flexibility for various devices under test.

We present measurements and analyses with single-emitter resolution for electroluminescence and photoluminescence on displays and wafers, and provide a preview of a mass production PL wafer tester using Instrument Systems' measurement devices.

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