Date: 2024/12/05
Dr. Tobias Steinel
Location: Trendforce Micro LEDforum 2024, Taipei/ Taiwan
Instrument Systems will discuss the challenges and solutions of µLED metrology and analysis for every single µLED on displays and wafers. The focus is on high-resolution imaging light measurement devices optimized for mass production speed, photometric accuracy traceable to national standards, and flexibility for various devices under test.
We present measurements and analyses with single-emitter resolution for electroluminescence and photoluminescence on displays and wafers, and provide a preview of a mass production PL wafer tester using Instrument Systems' measurement devices.