Multi-reference Imaging Light Measurement System

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Date: 2024/10/01, 11:25 AM (GMT-7)

Kevin Lange

Location: DSCC AR/VR Display Summit 2024, Fremont Marriott Silicon Valley/CA, USA


Emerging display technologies such as OLEDonSi and microLED present both new opportunities and challenges in display metrology. To achieve accurate color measurements for displays with spatially inhomogeneous spectral emissions, we propose a novel measurement device. The goal of the device is to measure very accurate and fast the angle dependent color properties of a display. 

Our solution is an imaging system equipped with a conoscopic lens, offering a wide field of view and multiple spectral reference points to correct for spectral variations. All spectral reference points are recorded in parallel by a multi-channel spectroradiometer. By combining camera images with spectral data, we effectively characterize the angular color properties of the display.
In our presentation, we will showcase a demonstration setup and share measurement results.

More information and registration