Rapid Testing of µLEDs and µDisplays on Wafer

The upcoming μLED display technology promises high contrast, fast response time, wide color gamut, low power consumption, and long lifetime.
But, the technology is challenging for optical quality control, especially for narrow bandwidth μLEDs.
In his talk, Mr. Tianxing Zhu, Customer Support Engineer at Konica Minolta Shanghai, gives insights into the validation of a software method to find, locate and analyze single emitters on a wafer or display image.