Lecture information: "Metrological Challenges of non-planar Displays"


The 3rd International Conference on Display Technology ICDT, due to take place in Kunshan / China from 26-28 March 2019 is organized by SID (Society for Information Display) and represents a good venue for display professionals. Instrument Systems will participate with a lecture. Our expert for New Display Technologies Andreas Kreisel takes the opportunity to talk about metrological challenges of display technologies. He will show the main metrological measurement differences between planar and cylindrical displays during measurement regarding lateral and directional uniformity of luminance and chromaticity, imaging light measurement devices (ILMD), and spot light measurement devices (spot LMD). Furthermore he will demonstrate the special requirements for the assessment of the optical characteristics of curved displays.

Lecture information:

Andreas Kreisel, Instrument Systems GmbH,
"Metrological Challenges of non-planar Displays"
Thursday, 28 March 2019: 5:40 PM – 6:00 PM
International Conference on Display Technology ICDT, China

Further information about the ICDT program