Press Releases




Comprehensive optical wafer testing for μLEDs at a single test station

Instrument Systems offers a unique camera-based measurement solution for μLED wafer testing that generates 2-dimensional, pixel-resolved optical analyses within given cycle times. The LumiTop 4000 has a resolution of 12 MP and can detect the smallest of defects and inhomogeneities on the wafer. Thanks to a 100 mm macro lens, the camera enables fast parallel inline analysis of all μLEDs on a wafer at a single test station.

Download press release

Precise radiation measurement in the UV range

Calibration UV-LEDs of the Instrument Systems ACS series are extremely stable UV sources on LED basis that are traceable to radiant flux. They exhibit an extremely low measurement uncertainty (k=2) of only 4.5% (UVC), 3.5% (UVB) and 2% (UVA) and are available for typical peak wavelengths 280 nm (ACS-570-24), 305 nm (ACS-570-26), and 365 nm (ACS-570-28). Calibration UV-LEDs are used for absolute calibration and monitoring of UV measuring equipment.

Download press release

Simplified evaluation of blue light hazard


New spectroradiometer speeds up LED production