企业动态

Get in touch with with us at the SIA VISION International Conference and Exhibition, 17 – 18 March 2021.

The rapidly emerging dominance of OLED technology for illumination and display applications is driving demand for a metrology tailored to these light sources.

Superior properties of µLEDs for display applications challenge metrology with, e.g, narrow emission bandwidth and enormous wavelength variability depending on their electronic driving parameters. Therefore, we developed new imaging test solutions to make color uniformity measurements fast and highly accurate even for strongly varying spectral properties of µLEDs.

Spectroradiometers with minimum measurement times in the micro-second range and precise triggering are required for conducting short-pulse measurements. For this purpose, Instrument Systems developed the new CAS 125 spectroradiometer with CMOS sensor and specially tailored readout electronics. This enables significantly more precise characterization of high-current-density LEDs, high-power LEDs with reduced heat-dissipation capability, or high luminance LEDs in development and production.