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News

News

SpecWin Pro 5.0 における TOP 300 サポートの改善

Instrument Systems のすべての分光放射計向け標準ソフトウェア SpecWin Pro 5.0 では、AR／VR／MR 放射輝度および輝度測定用オプティカルプローブ TOP 300 のサポートがさらに強化されました。

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Events

Events

SPIE.AR|VR|MR 2026

日付: 2026/01/17 – 2026/01/22
場所: アメリカ・サンフランシスコ

ブース #6501 にぜひお立ち寄りください！

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Technical Articles

Article

High Accuracy Optical Metrology for MicroLED Displays and Wafers

MicroLED mass production demands both speed and accuracy. In this article, Dr. Tobias Steinel presents a novel metrology approach that merges high-resolution…

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Talks

Talk

Impact of backgrounds on virtual image quality in AR glasses

日付: 2026/01/20 – 2026/01/20, 14:20 (GMT-7)

Dr. Sascha Reinhardt

場所: Moscone Center, San Francisco, CA/USA

Press Releases

Press

The new STA Stand‑Alone Screen Photometer for Fast, Vehicle‑based Headlamp Testing

Instrument Systems introduces the STA Stand‑Alone Screen Photometer — a modular, vehicle‑based measurement solution that combines the LumiCam 4000B imaging…

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Newsletter

Letter

Optical metrology innovations for automotive and MicroLED testing

Whether in vehicle laboratories or display and wafer production, precise optical metrology is key to ensuring quality and efficiency. In this issue, we present two…

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