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News

News

SpecWin Pro 5.0: Powerful Software Enhancements for precise Light Measurement

The release of SpecWin Pro 5.0 introduces a series of significant enhancements that further improve accuracy, flexibility, and efficiency in spectral light…

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Events

Events

SPIE.AR|VR|MR 2026

日付: 2026/01/17 – 2026/01/22
場所: アメリカ・サンフランシスコ

ブース #6501 にぜひお立ち寄りください！

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Technical Articles

Article

High Accuracy Optical Metrology for MicroLED Displays and Wafers

MicroLED mass production demands both speed and accuracy. In this article, Dr. Tobias Steinel presents a novel metrology approach that merges high-resolution…

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Talks

Talk

Impact of backgrounds on virtual image quality in AR glasses

日付: 2026/01/20 – 2026/01/20, 14:20 (GMT-7)

Dr. Sascha Reinhardt

場所: Moscone Center, San Francisco, CA/USA

Press Releases

Press

SpecWin Pro 5.0: New Major Software Release with Enhanced Modules and Optimized Device Integration

With SpecWin Pro 5.0, Instrument Systems expands the software for all their spectrometers with powerful new features: The release offers enhanced goniometer…

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Newsletter

Letter

Precision Meets Innovation: Your End‑of‑Year Edition

Stay ahead in optical metrology with our latest software updates, expert insights, and event news. In this issue, discover powerful new features in SpecWin Pro…

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