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News

Laser & Photonics Taiwan 2025 – ブース P1305 にぜひお越しください！

2025年8月20日～23日、台北南港展示センターにて、パートナー企業 Rapitech Enterprise とともに最新の光・ディスプレイ測定技術をご紹介します。

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Events

Events

CIOE 2025 - China International Optoelectronic Exposition

日付: 2025/09/10 – 2025/09/12
場所: Shenzhen World Exhibition & Convention Center, Shenzhen, China

Hall: 3, Booth: 3A40-9

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Technical Articles

Article

Comparative Measurements of Near-Eye Displays Using a Goniophotometer and an Imaging Light Measuring Device

How can manufacturers ensure both accuracy and efficiency when testing near-eye displays (NEDs) for AR and VR devices? A new study published on Wiley Online…

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Talks

Talk

High accuracy optical metrology for MicroLED displays and wafers

日付: 2025/09/25 – 2025/09/25, 13:30 (CEST)

Dr. Tobias Steinel

場所: Eindhoven, Netherlands

Press Releases

Press

High-end Metrology for an Excellent XR Experience

At SPIE AR|VR|MR 2025 and Photonics West 2025 in San Francisco, Instrument Systems will be presenting comprehensive solutions for optical quality control that…

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Newsletter

Letter

High-end Metrology for an excellent XR experience

Meet Instrument Systems in San Francisco this January at SPIE.AR|VR|MR and Photonics West. Discover our latest optical test solutions for AR/VR/XR displays – from…

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