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News

Display Week 2025 サンノゼでお会いしましょう

Instrument Systems は、2025年5月11日～16日に米国サンノゼで開催される Display Week 2025 に出展いたします。ドイツパビリオン内のブース #1040 にて、最新の高精度ディスプレイ測定技術をご紹介します。

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Events

Events

SPIE Optical Metrology

日付: 2025/06/23 – 2025/06/26
場所: International Congress Center Messe Munich

Discover cutting-edge metrology at the World of Photonics Congress! Join Dr. Frank Münchow on June 24 for insights into VCSEL polarization testing, and don’t miss Dr. Roland Schanz on June 26 as he…

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Technical Articles

Article

Vehicle Lighting as style element

German Article by Oliver Esterl

Road safety versus customer emotion - a goniophotometric test in accordance with UN-ECE R148 and R149 provides proof of conformity. …

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Talks

Talk

Comparative characterization of Polarization-Stable VCSELs: traditional rotating waveplate vs. advanced one-shot method

日付: 2025/06/24 – 2025/06/24, 14:30 (CEST)

Dr. Frank Münchow

場所: The World of Photonics Congress, ICM, Room 22a

Press Releases

Press

High-end Metrology for an Excellent XR Experience

At SPIE AR|VR|MR 2025 and Photonics West 2025 in San Francisco, Instrument Systems will be presenting comprehensive solutions for optical quality control that…

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Newsletter

Letter

High-end Metrology for an excellent XR experience

Meet Instrument Systems in San Francisco this January at SPIE.AR|VR|MR and Photonics West. Discover our latest optical test solutions for AR/VR/XR displays – from…

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