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Meeting Optical Testing Challenges of High-Resolution µLED-Displays

Dr. Tobias Steinel

SID Display Week 2020, virtual event

Spatial Uniformity Display Measurement, Session 71.3

Donnerstag, 6. August 2020

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Electro-optical transfer characteristic, the undervalued display feature

Dr. Michael E. Becker

SID Display Week 2020, virtual event

Display Measurement Standards I, Session 50.3

Donnerstag, 6.August, 2020

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Single pixel metrology of µ-LED displays

Dr. Martin Wolf

edc 2020

Nürnberg, Deutschland

Donnerstag, 27. Februar 2020, 14:15 - 14:35, Session 13

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High-fidelity imaging vs. artistic image rendering

Dr. Michael E. Becker

edc 2020

Nürnberg, Deutschland

Donnerstag, den 27. Februar 2020, 11:00 - 11:20, Session 11

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End-of-line (EOL) Testing of Recent OEM Display Quality Standards

Dr. Silke Kirchner

edc 2020

Nürnberg, Deutschland

Mittwoch, 26. Februar 2020, 16:35 - 16:55 Uhr, Session 6 Display Glass & Measurements

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2019

Light Measurement Device For Subpixel Evaluation Of Micro-LED And OLED Displays

Dr. Tobias Steinel

SSL China 2019

Tuesday November 26, 2019 11:40am

Shenzhen Convention and Exhibition Center (5th Floor Peony Hall), China

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Characterization of Blue Light Hazard

Dr. Ðenan Konjhodžić

Lux et Color Vesprimiensis

Völgyikút Ház, Veszprém, Hungary

Donnerstag, 10. Oktober 2019, 16:20 Uhr

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An Evaluation Guide for Blue Light Hazard

Dr. Ðenan Konjhodžić

LED professional Symposium + Expo

Seestudio, Opera House Bregenz, Österreich

Donnerstag, 26. September 2019, 11:30-12:00 Uhr

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End-Of-Line Testing of Recent Display Quality Standards

Dr. Silke R. Kirchner

SID Vehicle Displays and Interfaces 2019

Burton Manor Conference Center, Livonia, MI, USA

Mittwoch, 25. September 2019, 9:15 – 9:35 Uhr, Session 5.4

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Ultra high resolution imaging light measurement device for subpixel metrology of micro-LEDs and OLEDs

J.Blanke, T.Steinel, M.Wolf

EuroDisplay 2019

Minsk, Belarus, Stork Room 1, O-43

Donnerstag, 19. September 2019, 10:05 Uhr, Session 7

Mehr

Evaluation of Blue Light Hazard

Dr. Ðenan Konjhodžić

CIE 2019 29th Quadrennial Session

Washington DC, USA

Dienstag, 18. Juni 2019, 09:20-10:20 Uhr, Session PA3-2

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Flicker from Electronic Displays: Reconsidering the Confusion

Dr. Michael E. Becker

SID Display Week

San Francisco Moscone Center, CA, USA, Raum LL20A

Session 50.1, Co-Chair: Jürgen Neumeier (Instrument Systems GmbH)

Donnerstag, 16. Mai 2019, 09:00-10:20 Uhr

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Metrological Challenges of Non-Planar Displays

Andreas Kreisel

ICDT International Conference on Display Technology 2019

Kunshan, Suzhou, China

Donnerstag, 28. März 2019, 17:40 -18:00 Uhr

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