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About measurement systems in the UV A/B/C range

Datum: 29.06.2021, 15:40 (Taipeh, Taiwan)

Dr. Ðenan Konjhodžić

Ort: CIE Taiwan Annual Meeting, Taipei (Taiwan)/ Virtuelles Event

Nowadays, the pandemic situation caused by the COVID-19 virus inspired many companies, research institutes and lighting designers to adopt UV radiation as a new tool in their projects and research. The promising germicidal effect of the UVC radiation also on the Coronavirus raises the question of the reliable measurement of the UV radiation. However, this complex task needs an expertise and appropriate equipment.

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MicroLED Messtechnik: Herausforderungen und Lösungen

Datum: 01.06.2021, Session 25/ 13:50 - 14:10 (Peking)

Dr. Tobias Steinel

Ort: ICDT, Online / Beijing Etrong International Exhibition & Convention Center, Konferenzhalle 1, Meetingraum C

Die aufstrebende μLED Displaytechnologie verspricht hohe Kontraste, schnelle Antwortzeiten, ein breites Farbspektrum, geringen Energieverbrauch und Langlebigkeit. Jedoch ist die Technologie nicht nur eine Herausforderung hinsichtlich des Massentransfers der μLED vom Wafer auf das Display, sondern auch hinsichtlich der massiven Parallelisierung optischer Qualitätskontrolle in unterschiedlichen Fertigungsschritten.

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Color Uniformity of µLED Displays: New Color Calibration Concept for Fast and Accurate Optical Testing

Datum: 21.05.2021

Dr. Tobias Steinel

Ort: Display Week 2021 Virtual Conference

Superior properties of µLEDs for display applications challenge metrology with, e.g, narrow emission bandwidth and enormous wavelength variability depending on their electronic driving parameters. Therefore, we developed new imaging test solutions to make color uniformity measurements fast and highly accurate even for strongly varying spectral properties of µLEDs.

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Short Course S-2: Fundamentals of Display Metrology

Datum: 20.05.2021

Dr. Reto Häring in cooperation with Konica Minolta and Radiant Vision Systems

Ort: Display Week 2021 Virtual Conference

This short course will provide a fundamental understanding of display metrology and introduce measurement equipment and techniques. It is held in cooperation with Konica Minolta and Radiant Vision Systems.

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Measurement systems and calibrations for UV radiation

Datum: 20.04.2021, 13:00

Dr. Ðenan Konjhodžić

Ort: Online

Nowadays, the pandemic situation caused by the COVID-19 virus inspired many companies, research institutes and lighting designers to adopt UV radiation as a new tool in their projects and research. The promising germicidal effect of the UVC radiation also on the Coronavirus raises the question of the reliable measurement of the UV radiation. However, this complex task needs an expertise and appropriate equipment.

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Quality control of AR/VR near-eye-displays: Goniometric versus advanced 2D imaging light measurements

Datum: 28.03.2021 – 30.03.2021

Dr. Tobias Steinel

Ort: SPIE AR/VR/MR, Live on Demand, Conference 11765-36

Novel display technologies for AR/VR/MR devices require advanced imaging systems to control quality during assembly and to calibrate the device. Such calibration yields an optimal match of left and right eye and allows color management for an accurate match of real world and virtual objects. For accurate measurement, such an imaging system should be based on a lens system that mimics the human eye system and have a similar-sized entrance pupil in front of the lens. Traditionally two approaches have been proposed:

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Human-Centric Quality Control of AR/VR Near-Eye-Displays and AR-HUDs

Datum: 05.03.2021, 11:20

Dr. Tobias Steinel

Ort: electronic displays Conference 2021 Digital

Novel display technologies for augmented and virtual reality (AR/VR/MR/XR) devices, like Head-Mounted-Devices and Head-Up-Displays, require advanced imaging systems and calibration to control quality during assembly to accurately match the real world and virtual objects. We demonstrate and compare advantages of goniometric sampling spot measurements and camera based imaging solutions.

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Characterization of VCSELs for 3D sensing applications according to the IEC60825-1 Standard

Datum: 19.01.2021, 07:00 (EST)

Dr. Katharina Predehl

Ort: Online Event

VCSELs have special properties in contrast to other typical laser sources. As a result, VCSEL eye safety evaluation is more complex and a couple of additional aspects have to be considered that would not apply for "normal" lasers. Consequently, the validation of a VCSEL's laser class is not trivial, and even more so because an easily understandable guideline for the assessment of VCSEL safety has not yet been published.

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2020

Methods to measure the luminous color of white and colored LEDs

Datum: 02.12.2020 – 02.12.2020

Dr. Hassan Gargouri

Ort: DVN Tokio 2020

Datum: 2. Dezember, 2020

Zeit: 17:15 (CET)

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New LED calibration standards in the UV A/B/C range

Datum: 22.09.2020 – 25.09.2020

Dr. Đenan Konjhodžić

LpS Digital 2020

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Eye safety of VCSEL arrays

Datum: 11.09.2020 – 11.09.2020

Ort: Dr. Katharina Predehl

China International Optoelectronic Exposition

IEEE OGC Conference

Virtuelles Event

Freitag 11. September, 2020

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Proven solutions for testing μLED wafers, AR/VR Near-Eye displays and VCSEL arrays

Datum: 10.09.2020 – 10.09.2020

Collin Jiang

Ort: China International Optoelectronic Exposition

Photonics Germany @ CIOE 2020

Datum: 10. September, 2020

Zeit: 13:00 – 17:00 Shenzhen

Ort: World Exhibition & Convention Center ∙ Konferenzraum 2, Halle 1

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Meeting Optical Testing Challenges of High-Resolution µLED-Displays

Datum: 06.08.2020 – 05.08.2020

Dr. Tobias Steinel

SID Display Week 2020, virtual event

Spatial Uniformity Display Measurement, Session 71.3

Donnerstag, 6. August 2020

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Electro-optical transfer characteristic, the undervalued display feature

Datum: 06.08.2020 – 06.08.2020

Dr. Michael E. Becker

SID Display Week 2020, virtual event

Display Measurement Standards I, Session 50.3

Donnerstag, 6.August, 2020

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Single pixel metrology of µ-LED displays

Datum: 27.02.2020 – 27.02.2021

Dr. Martin Wolf

edc 2020

Nürnberg, Deutschland

Donnerstag, 27. Februar 2020, 14:15 - 14:35, Session 13

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High-fidelity imaging vs. artistic image rendering

Datum: 26.02.2020 – 26.02.2021

Dr. Michael E. Becker

edc 2020

Nürnberg, Deutschland

Donnerstag, den 27. Februar 2020, 11:00 - 11:20, Session 11

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End-of-line (EOL) Testing of Recent OEM Display Quality Standards

Datum: 26.02.2020 – 26.02.2020

Dr. Silke Kirchner

edc 2020

Nürnberg, Deutschland

Mittwoch, 26. Februar 2020, 16:35 - 16:55 Uhr, Session 6 Display Glass & Measurements

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2019

Light Measurement Device For Subpixel Evaluation Of Micro-LED And OLED Displays

Datum: 26.11.2019

Dr. Tobias Steinel

SSL China 2019

Tuesday November 26, 2019 11:40am

Shenzhen Convention and Exhibition Center (5th Floor Peony Hall), China

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Characterization of Blue Light Hazard

Datum: 10.10.2019 – 31.12.2019

Dr. Ðenan Konjhodžić

Lux et Color Vesprimiensis

Völgyikút Ház, Veszprém, Hungary

Donnerstag, 10. Oktober 2019, 16:20 Uhr

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An Evaluation Guide for Blue Light Hazard

Datum: 26.09.2019 – 31.12.2019

Dr. Ðenan Konjhodžić

LED professional Symposium + Expo

Seestudio, Opera House Bregenz, Österreich

Donnerstag, 26. September 2019, 11:30-12:00 Uhr

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End-Of-Line Testing of Recent Display Quality Standards

Datum: 25.09.2019 – 31.12.2019

Dr. Silke R. Kirchner

SID Vehicle Displays and Interfaces 2019

Burton Manor Conference Center, Livonia, MI, USA

Mittwoch, 25. September 2019, 9:15 – 9:35 Uhr, Session 5.4

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Ultra high resolution imaging light measurement device for subpixel metrology of micro-LEDs and OLEDs

Datum: 19.09.2019 – 31.12.2019

J.Blanke, T.Steinel, M.Wolf

EuroDisplay 2019

Minsk, Belarus, Stork Room 1, O-43

Donnerstag, 19. September 2019, 10:05 Uhr, Session 7

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Evaluation of Blue Light Hazard

Datum: 18.06.2019 – 31.12.2019

Dr. Ðenan Konjhodžić

CIE 2019 29th Quadrennial Session

Washington DC, USA

Dienstag, 18. Juni 2019, 09:20-10:20 Uhr, Session PA3-2

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Flicker from Electronic Displays: Reconsidering the Confusion

Datum: 16.05.2019 – 31.12.2019

Dr. Michael E. Becker

SID Display Week

San Francisco Moscone Center, CA, USA, Raum LL20A

Session 50.1, Co-Chair: Jürgen Neumeier (Instrument Systems GmbH)

Donnerstag, 16. Mai 2019, 09:00-10:20 Uhr

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Metrological Challenges of Non-Planar Displays

Datum: 28.03.2019 – 31.12.2019

Andreas Kreisel

ICDT International Conference on Display Technology 2019

Kunshan, Suzhou, China

Donnerstag, 28. März 2019, 17:40 -18:00 Uhr

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