High accuracy optical metrology for MicroLED displays and wafers

Datum: 25.09.2025 – 25.09.2025, 14:50 Uhr (CEST)

Dr. Tobias Steinel

Ort: Eindhoven, Netherlands


This presentation will address common challenges faced when testing microLEDs — both on displays and wafers — and how precise optical measurements can increase quality and efficiency in manufacturing.

We’ll focus on high-resolution imaging systems that combine fast measurement speed, traceable photometric accuracy and flexibility for different DUTs. Real-world examples will show how single microLEDs can be measured using electroluminescence and photoluminescence techniques.

As a preview, we’ll also share insights into an upcoming photoluminescence testing system for wafer-level mass production.
 

Register here