High accuracy optical metrology for MicroLED displays and wafers

日付: 2025/09/25 – 2025/09/25, 14:50 (CEST)

Dr. Tobias Steinel

場所: Eindhoven, Netherlands


This presentation will address common challenges faced when testing microLEDs — both on displays and wafers — and how precise optical measurements can increase quality and efficiency in manufacturing.

We’ll focus on high-resolution imaging systems that combine fast measurement speed, traceable photometric accuracy and flexibility for different DUTs. Real-world examples will show how single microLEDs can be measured using electroluminescence and photoluminescence techniques.

As a preview, we’ll also share insights into an upcoming photoluminescence testing system for wafer-level mass production.
 

Register here