High accuracy optical metrology for MicroLED displays and wafers

This presentation will address common challenges faced when testing microLEDs — both on displays and wafers — and how precise optical measurements can increase quality and efficiency in manufacturing.

We’ll focus on high-resolution imaging systems that combine fast measurement speed, traceable photometric accuracy and flexibility for different DUTs. Real-world examples will show how single microLEDs can be measured using electroluminescence and photoluminescence techniques.

As a preview, we’ll also share insights into an upcoming photoluminescence testing system for wafer-level mass production.