VCSEL Measurement VCSEL characterization with spectral resolution down to 0.12 nm
Precise systems for reliable characterization of VCSELs
VCSELs are characterized by excellent beam properties and are thus particularly suitable for critical applications. Typical examples are facial recognition via LiDAR. The use of laser diodes in the presence of humans, however, makes precise characterization of their beam properties essential and presents enormous challenges to the measuring system used.
Based on the high-resolution version of the CAS series of spectroradiometers, Instrument Systems offers a measuring system optimally tuned to VCSEL characterization in the lab. With the appropriate accessories it fulfils diverse individual requirements. Feel free to contact us!
Key Features:
- Excellent spectral resolution down to 0.12 nm
- Integration times from 4 ms
- Array spectroradiometer specially for pulsed laser diodes / VCSELs
Requirements
Laser diodes typically offer extremely high performance in a very narrow spectral range. Instrument Systems thus offers spectroradiometers with a very high spectral resolution up to 0.1x nm and integration times from 4 ms for the measurement of VCSELs in the lab. An advantage of the traceable absolute calibration of these spectroradiometers is the simple calculation of radiant flux from the measured spectrum. Optionally, the measuring system can be expanded by a photodiode, e.g. for measuring the pulse form of a pulsed laser diode. A dedicated system is available if pulses down to the ns range shall be tested (PVT 110). Please contact us if you have such requirements.
System configuration
An all-in-one system for determining the radiant flux of laser diodes/VCSELs in the lab typically comprises the following components:
Advice on our systems
Our system experts will be pleased to provide competent advice on your particular application. Just ask us!
