Characterization and Prevention of Global and Rolling Shutter Artefacts in Display Metrology

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日付: 2023/03/15, 16:10 (GMT+1)

Andreas Liebel

場所: electronic displays conference, Nuremberg/Germany


State of the art displays do have the ability to modulate refresh rate and duty cycle in order to save energy and to adapt to the display content. These features pose new challenges to display metrology equipment and may produce image artefacts. Here, we discuss the characterization and prevention of image artefacts due to the shutter type of the camera used for high accuracy display testing.

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