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Đenan Konjhodžić, product manager at Instrument Systems, presents the new calibration concept for UV-LED standards. He gives a brief summary of the market trends for UV-LEDs and introduces then the new UV LED calibration standards of the ACS series. Of particular interest is the innovative calibration concept for radiant flux.

Online booth

Short presentation: Light Measurement Solutions for the LIDAR Value Chain,

Speaker: Armin Heinrichsdobler

Date: Wednesday 23rd of September 12:15 - 12:20 PM

The authors summarize a UV-LED calibration concept that relies upon radiant flux, and emphasize the advantages for developing measurement standards in the increasingly important UV spectral range. The extremely low measurement uncertainties (k=2) of the UV-ACS are comparably low to those in the metrologically unproblematic visible range, thereby offering a reliable resource for radiant flux calibration in the UV-A, UV-B, and UV-C ranges.

China International Optoelectronic Exposition

IEEE OGC Conference

Virtual Event

Friday, September 11, 2020

Instrument Systems offers a unique camera-based measurement solution for μLED wafer testing that generates 2-dimensional, pixel-resolved optical analyses within given cycle times. The LumiTop 4000 has a resolution of 12 MP and can detect the smallest of defects and inhomogeneities on the wafer. Thanks to a 100 mm macro lens, the camera enables fast parallel inline analysis of all μLEDs on a wafer at a single test station.