News Portal: Instrument Systems

News

Electronica 2020 – Explore our current key topics!

02.11.2020

Instrument Systems will be presenting top themes for Electronica in virtual form.

Exhibitions and Conferences

DVN Workshop conference & expo

Tokyo
02.12.2020 - 02.12.2020

Lecture: 5:15 pm (CET)
Speaker: Dr. Hassan Gargouri
Topic: Methods to measure the luminous color of white and colored LEDs

Technical Articles

UV LED sources demand calibration to precise measurements for safe operation

Article by Bastian Eder and Denan Konjhodzic
14.09.2020

The authors summarize a UV-LED calibration concept that relies upon radiant flux, and emphasize the advantages for developing measurement standards in the increasingly important UV spectral range. The extremely low measurement uncertainties (k=2) of the UV-ACS are comparably low to those in the metrologically unproblematic visible range, thereby offering a reliable resource for radiant flux calibration in the UV-A, UV-B, and UV-C ranges.

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Lectures

Methods to measure the luminous color of white and colored LEDs

Dr. Hassan Gargouri
DVN Tokyo 2020

Date: December 2, 2020

Time: 17:15 (CET)

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Press Releases

Comprehensive optical wafer testing for μLEDs at a single test station

07.07.2020

Instrument Systems offers a unique camera-based measurement solution for μLED wafer testing that generates 2-dimensional, pixel-resolved optical analyses within given cycle times. The LumiTop 4000 has a resolution of 12 MP and can detect the smallest of defects and inhomogeneities on the wafer. Thanks to a 100 mm macro lens, the camera enables fast parallel inline analysis of all μLEDs on a wafer at a single test station.

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