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Visit us at our virtual booth during Display Week, 17 -20 May, and join our lectures.

The rapidly emerging dominance of OLED technology for illumination and display applications is driving demand for a metrology tailored to these light sources.

Superior properties of µLEDs for display applications challenge metrology with, e.g, narrow emission bandwidth and enormous wavelength variability depending on their electronic driving parameters. Therefore, we developed new imaging test solutions to make color uniformity measurements fast and highly accurate even for strongly varying spectral properties of µLEDs.

At Display Week 2021, Instrument Systems will showcase an extraordinary portfolio of light measurement technology with unprecedented accuracy for the perfect user experience with displays of all types.