Presentation at edc 2023 in Nuremberg
At edc 2023 Instrument Systems will present a presentation about “Characterization and Prevention of Global and Rolling Shutter Artefacts in Display Metrology”. Andreas Liebel will discuss the systematic characterization of image artifacts depending on the shutter type of the light measurement camera and propose means to safely prevent these artefacts for high accuracy display testing. State of the art displays do have the ability to modulate refresh rate and duty cycle in order to save energy and to adapt dynamically to the display content. These features pose new challenges to display metrology equipment and may produce image artefacts.