VCSEL Production Testing Complete characterization of pulsed VCSELs
Sturdy complete system for VCSEL in-process inspection
In-process inspection of laser diodes/VCSELs calls for a high level of precision and stability when choosing a measuring system. Reliable and precise measurement of optical properties and temporal pulse performance is a prerequisite for the reproducible characterization and sorting of laser diodes in the production process.
Based on the high-resolution variants of the CAS series spectroradiometers, Instrument Systems offers several complete solutions, in addition to the VCSEL lab measuring station, that are optimally tailored to VCSEL characterization in production.
The modular design of Instrument Systems' measurement solutions and the outstanding spectral resolution of the CAS-HR series (CAS 140D-HR, CAS 120-HR, CAS 125-HR) enable a wide range of applications. By integrating a traceable, absolutely calibrated photodiode, radiant flux can be provided as a direct measurand—critical for ensuring measurement accuracy.
Furthermore, a direct view fast photodiode can be integrated for measuring the trace of a single pulse or a complete pulse train. This requires additional driver and readout electronics which operates in the gigahertz range.
Key Features:
- Array spectroradiometer specially for pulsed laser diodes/VCSELs
- High spectral resolution up to 0.12 nm
- Reliable and cost-efficient solution for production and lab
- Optional performance measurement with a calibrated photodiode
- Optional measurement of extremely short pulses as low as 1 ns
Requirements
It is of paramount importance in the production environment to maintain a high throughput rate (UPH) with short cycle times. Laser diodes typically have high power in a very narrow spectral range, ensuring adequate modulation of the detector with short integration times. A measuring system with the shortest possible measuring time is thus necessary for cycle-precise capture of the relevant readings with high throughput.
Sophisticated electronics are required, in particular for the characterization of very short and high frequency pulses, as the short pulses must be generated at currents of 10 A and more, and the measurement data must be captured with sampling rates of several gigahertz.
System configuration
The all-in-one system from Instrument Systems for fast and precise measurement of radiant flux of laser diodes/VCSELs in production typically comprises the following components:
Individual configuration
Our system experts will be pleased to provide competent advice on your particular application. Our global Service guarantees fast set-up and full support over the entire lifetime of the system. Together we will find the right solution – just ask us!
