Current Lectures
Current Lectures – Our Experts Live
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Electro-optical transfer characteristic, the undervalued display feature
Dr. Michael E. Becker
Meeting Optical Testing Challenges of High-Resolution µLED-Displays
Dr. Tobias Steinel
Single pixel metrology of µ-LED displays
Dr. Martin Wolf
High-fidelity imaging vs. artistic image rendering
Dr. Michael E. Becker
End-of-line (EOL) Testing of Recent OEM Display Quality Standards
Dr. Silke Kirchner
2019
Light Measurement Device For Subpixel Evaluation Of Micro-LED And OLED Displays
Dr. Tobias Steinel
Characterization of Blue Light Hazard
Dr. Ðenan Konjhodžić
An Evaluation Guide for Blue Light Hazard
Dr. Ðenan Konjhodžić
End-Of-Line Testing of Recent Display Quality Standards
Dr. Silke R. Kirchner
Ultra high resolution imaging light measurement device for subpixel metrology of micro-LEDs and OLEDs
J.Blanke, T.Steinel, M.Wolf
Evaluation of Blue Light Hazard
Dr. Ðenan Konjhodžić
Flicker from Electronic Displays: Reconsidering the Confusion
Dr. Michael E. Becker
Metrological Challenges of Non-Planar Displays
Andreas Kreisel